US9312834B1ActiveUtility
Low leakage flip-flop circuit
Est. expiryJan 8, 2035(~8.5 yrs left)· nominal 20-yr term from priority
H03K 3/35625H03K 3/012
76
PatentIndex Score
5
Cited by
10
References
20
Claims
Abstract
An integrated circuit having reduced power consumption includes a clock-gating cell, a transistor and a flip-flop. The clock-gating cell receives a dynamic enable signal, generates a latched-enable signal and gates a clock signal provided to the flip-flop. The flip-flop includes first and second latches. The transistor receives an inverted latched-enable signal from the clock-gating cell and switches ON or OFF based on the logic state of the inverted latched-enable signal. The transistor provides a voltage signal to the flip-flop circuit based on the state of the flip-flop in order to control the state of the flip-flop, which reduces power consumption of the integrated circuit.
Claims
exact text as granted — not AI-modifiedThe invention claimed is:
1. An integrated circuit, comprising:
a clock-gating cell for receiving an enable signal and a clock signal and generating a gated-clock signal and a latched-enable signal;
a transistor having a gate terminal connected to the clock-gating cell by way of a first NOT gate for receiving an inverted latched-enable signal, a first diffusion terminal for receiving a supply voltage signal, and a second diffusion terminal for providing the supply voltage signal when the inverted latched-enable signal is in a first logic state;
a first latch having an input terminal for receiving an input signal, a first power terminal connected to the second diffusion terminal of the transistor for receiving the supply voltage signal, a second power terminal connected to ground, a clock terminal connected to the clock-gating cell for receiving the gated-clock signal, and an output terminal for outputting an intermediate output signal; and
a second latch having an input terminal connected to the output terminal of the first latch for receiving the intermediate output signal, a first power terminal for receiving the supply voltage signal, a second power terminal connected to ground, a clock terminal connected to the clock-gating cell by way of a second NOT gate for receiving an inverted gated-clock signal, and an output terminal for outputting an output signal.
2. The integrated circuit of claim 1 , wherein the clock-gating cell comprises:
a third latch having an input terminal for receiving the enable signal, a first power terminal for receiving the supply voltage signal, a second power terminal connected to ground, a clock terminal for receiving the clock signal, and an output terminal for outputting the latched-enable signal; and
an AND gate having a first input terminal connected to the output terminal of the third latch for receiving the latched-enable signal, a second input terminal for receiving the clock signal, and an output terminal for generating the gated-clock signal.
3. The integrated circuit of claim 2 , wherein the first and third latches each comprise a negative level-sensitive latch and the second latch comprises a positive level-sensitive latch.
4. The integrated circuit of claim 2 , wherein the first and third latches each comprise a positive level-sensitive latch and the second latch comprises a negative level-sensitive latch.
5. The integrated circuit of claim 2 , wherein the first, second and third latches each comprise a D-type latch.
6. The integrated circuit of claim 1 , wherein the transistor is switched off when the inverted latched-enable signal is in a second logic state, thereby switching off the first latch.
7. The integrated circuit of claim 6 , wherein the first logic state is a logic low state and the second logic state is a logic high state.
8. The integrated circuit of claim 1 , wherein the transistor comprises a p-channel metal-oxide semiconductor (PMOS) transistor.
9. An integrated circuit, comprising:
a clock-gating cell for receiving an enable signal and a clock signal and generating a gated-clock signal and a latched-enable signal;
a first latch having an input terminal for receiving an input signal, a first power terminal for receiving a supply voltage signal, a clock terminal connected to the clock-gating cell for receiving the gated-clock signal, and an output terminal for outputting an intermediate output signal;
a second latch having an input terminal connected to the output terminal of the first latch for receiving the intermediate output signal, a first power terminal for receiving the supply voltage signal, a second power terminal connected to ground, a clock terminal connected to the clock-gating cell by way of a first NOT gate for receiving an inverted gated-clock signal, and an output terminal for outputting an output signal; and
a transistor having a gate terminal connected to the clock-gating cell for receiving a latched-enable signal, a first diffusion terminal connected to a second power terminal of the first latch, and a second diffusion terminal connected to ground, wherein the transistor is switched on when the latched-enable signal is in a first logic state.
10. The integrated circuit of claim 9 , wherein the clock-gating cell comprises:
a third latch having an input terminal for receiving the enable signal, a first power terminal for receiving the supply voltage signal, a second power terminal connected to ground, a clock terminal for receiving the clock signal, and an output terminal for outputting the latched-enable signal; and
an AND gate having a first input terminal connected to the output terminal of the third latch for receiving the latched-enable signal, a second input terminal for receiving the clock signal, and an output terminal for generating the gated-clock signal.
11. The integrated circuit of claim 10 , wherein the first and third latches each comprise a negative level-sensitive latch and the second latch comprises a positive level-sensitive latch.
12. The integrated circuit of claim 10 , wherein the first, second and third latches each comprise a D-type latch.
13. The integrated circuit of claim 9 , wherein the transistor is switched off when the latched-enable signal is in a second logic state thereby switching off the first latch.
14. The integrated circuit of claim 13 , wherein the first logic state is a logic high state and the second logic state is a logic low state.
15. The integrated circuit of claim 9 , wherein the transistor is an n-channel metal-oxide semiconductor (NMOS) transistor.
16. An integrated circuit, comprising:
a first latch having an input terminal for receiving an enable signal, a first power terminal for receiving a supply voltage signal, a second power terminal connected to ground, a clock terminal for receiving a clock signal, and an output terminal for generating a latched-enable signal;
an AND gate having a first input terminal connected to the output terminal of the first latch for receiving the latched-enable signal, a second input terminal for receiving the clock signal, and an output terminal for generating a gated-clock signal;
a p-channel metal oxide semiconductor (PMOS) transistor having a gate terminal connected to the output terminal of the first latch by way of a first NOT gate for receiving an inverted latched-enable signal, a first diffusion terminal for receiving the supply voltage signal, and a second diffusion terminal for providing the supply voltage signal when the inverted latched-enable is in a first logic state;
a second latch having an input terminal for receiving an input signal, a first power terminal connected to the second diffusion terminal of the PMOS transistor for receiving the supply voltage signal, a second power terminal connected to ground, a clock terminal connected to the output terminal of the AND gate for receiving the gated-clock signal, and an output terminal for outputting an intermediate output signal; and
a third latch having an input terminal connected to the output terminal of the second latch for receiving the intermediate output signal, a first power terminal for receiving the supply voltage signal, a second power terminal connected to ground, a clock terminal connected to the output terminal of the AND gate by way of a second NOT gate for receiving an inverted gated-clock signal, and an output terminal for outputting an output signal.
17. The integrated circuit of claim 16 , wherein the first and second latches each comprise a negative level-sensitive latch and the third latch comprises a positive level-sensitive latch.
18. The integrated circuit of claim 16 , wherein the first, second and third latches each comprise a D-type latch.
19. The integrated circuit of claim 16 , wherein the PMOS transistor is switched off when the inverted latched-enable signal is in a second logic state, thereby switching off the second latch.
20. The integrated circuit of claim 19 , wherein the first logic state is a logic low state and the second logic state is a logic high state.Cited by (0)
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