P
US9753192B2ActiveUtilityPatentIndex 52

Reflector, adjustment method, and position detection apparatus

Assignee: SEIKO EPSON CORPPriority: Jan 21, 2014Filed: Jan 16, 2015Granted: Sep 5, 2017
Est. expiryJan 21, 2034(~7.5 yrs left)· nominal 20-yr term from priority
Inventors:FURUKAWA TATSUYA
G06F 3/042G06F 3/0428G06F 3/0421G02B 5/09G06F 3/0418G06F 3/0416
52
PatentIndex Score
1
Cited by
5
References
6
Claims

Abstract

A reflector that is used for adjusting a radiation direction of a radiation unit in a position detection apparatus that performs a process based on a detected position of reflected light of light radiated from the radiation unit includes a first reflection surface that reflects the light radiated from the radiation unit, and a second reflection surface that intersects with the first reflection surface and reflects the light radiated from the radiation unit.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
       1. A reflector that is used for adjusting a radiation direction of a radiation unit in a position detection apparatus that performs a process based on a detected position of reflected light of light radiated from the radiation unit, the reflector comprising:
 a first reflection surface that reflects the light radiated from the radiation unit; and 
 a second reflection surface that intersects with the first reflection surface and reflects the light radiated from the radiation unit. 
 
     
     
       2. The reflector according to  claim 1 ,
 wherein the first reflection surface is provided in a member that extends in a first direction, and 
 the second reflection surface is provided in a member that extends in a second direction which is different from the first direction and further is formed in the member that extends in the second direction so as to be inclined from a side on which the first reflection surface intersects with the second reflection surface to the opposite side. 
 
     
     
       3. The reflector according to  claim 2 ,
 wherein when the reflector is installed on a flat surface, the first direction is a direction away from the flat surface, 
 the second direction is a direction substantially parallel to the flat surface, and 
 the second reflection surface is inclined such that the height from the flat surface is higher on the side on which the first reflection surface intersects with the second reflection surface than on the opposite side. 
 
     
     
       4. The reflector according to  claim 3 ,
 wherein the height of the inclination of the second reflection surface is greater than the width of the light radiated from the radiation unit in the height direction of the inclination. 
 
     
     
       5. An adjustment method that is used for adjusting a radiation direction of light from a radiation unit in a position detection apparatus that performs a process based on a detected position of reflected light formed by reflection of the light radiated from the radiation unit from a reflector, the method comprising:
 using a reflector including a first reflection surface that reflects the light radiated from the radiation unit, and a second reflection surface that intersects with the first reflection surface and reflects the light radiated from the radiation unit as the reflector; 
 detecting a position of light reflected from the reflector; and 
 adjusting the radiation direction based on the detected position of the reflected light. 
 
     
     
       6. A position detection apparatus comprising:
 a detection unit that detects a position of light reflected from a reflector including a first reflection surface that reflects light radiated from a radiation unit, and a second reflection surface that intersects with the first reflection surface and reflects the light radiated from the radiation unit; 
 a determination unit that determines whether the position of the reflected light detected by the detection unit is on the first reflection surface or the second reflection surface; and 
 an output unit that outputs information according to the determination result from the determination unit.

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