US9793240B2ActiveUtilityA1

Multiple die layout for facilitating the combining of an individual die into a single die

84
Assignee: SILICON LAB INCPriority: Sep 30, 2009Filed: Oct 31, 2014Granted: Oct 17, 2017
Est. expirySep 30, 2029(~3.2 yrs left)· nominal 20-yr term from priority
H10W 72/07651H10W 72/60H10W 72/5449H10W 90/756H10W 90/753H10W 72/5445H10W 72/932H10W 72/851H10W 72/655H10W 72/652H10W 90/811H10W 72/0198H10W 72/00H10W 70/465H10W 42/00H10W 90/00H01L 2924/19041H01L 23/4952H01L 2224/48247H01L 2924/00014H01L 23/585H01L 2924/14H01L 2924/207H01L 2924/01033H01L 2224/05554H01L 2924/10161H01L 2924/00H01L 23/52H01L 2224/45099H01L 2224/40H01L 2224/48106H01L 2224/48257H01L 24/73H01L 2224/45015H01L 23/49575H01L 2224/48137H01L 25/0655H01L 24/97H01L 24/49H01L 24/48H01L 2924/01082H01L 2224/49171
84
PatentIndex Score
6
Cited by
6
References
10
Claims

Abstract

An apparatus includes a wafer portion and a plurality of die fabricated in the wafer portion in a defined pattern such that the die are separated from each other by a dicing area or a street. The apparatus includes a conductive connection between given adjacent die. The conductive connection is electrically coupled to circuitry disposed on the given adjacent die.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
       1. An apparatus comprising:
 a wafer portion; 
 a plurality of die fabricated in the wafer portion in a defined pattern such that the die of the plurality die are separated from each other by a dicing area or a street, the plurality of die comprising a first die adjacent to a second die; 
 a conductive connection between the first die and the second die, wherein the conductive connection electrically couples circuitry disposed on the first die to circuitry disposed on the second die, wherein the conductive connection is electrically interfaced to a power connection on the first die and a power provided to the first die is applied through the conductive connection to the second die; and 
 a material to encapsulate the wafer portion. 
 
     
     
       2. The apparatus of  claim 1 , wherein the conductive connection comprises a metal layer. 
     
     
       3. The apparatus of  claim 1 , wherein the conductive connection communicates power between the first die, the apparatus further comprising another conductive connection between the first die and the second die and being associated with ground. 
     
     
       4. The apparatus of  claim 1 , further comprising another conductive connection to communicate an electrical signal during operation of each of the first and second die, and wherein the electrical signal is associated with a signal other than a power supply or ground. 
     
     
       5. The apparatus of  claim 1 , wherein the conductive connection is disposed in a metal layer on the top level of the die. 
     
     
       6. The apparatus of  claim 5 , further comprising a passivation layer disposed over the wafer covering at least the die and at least the conductive connection within the street between the first and second die. 
     
     
       7. The apparatus of  claim 1 , wherein the plurality of die comprises circuitry, the apparatus further comprising:
 an electrical contact exposed outside of the material to form an electrical connection with the circuitry. 
 
     
     
       8. The apparatus of  claim 7 , further comprising a lead frame. 
     
     
       9. An apparatus comprising:
 a wafer portion; 
 a plurality of die fabricated in the wafer portion in a defined pattern such that the die of the plurality die are separated from each other by a dicing area or a street, the plurality of die comprising a first die adjacent to a second die, wherein the first die is identical to the second die; 
 a conductive connection between the first die and the second die, wherein the conductive connection electrically couples circuitry disposed on the first die to circuitry disposed on the second die; and 
 a material to encapsulate the wafer portion. 
 
     
     
       10. An apparatus comprising:
 a wafer portion; 
 a plurality of die fabricated in the wafer portion in a defined pattern such that the die of the plurality die are separated from each other by a dicing area or a street, the plurality of die comprising a first die adjacent to a second die, wherein circuitry disposed on the first die performs a function not performed by circuitry on the second die; 
 a conductive connection between the first die and the second die, wherein the conductive connection electrically couples circuitry disposed on the first die to circuitry disposed on the second die; and 
 a material to encapsulate the wafer portion.

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