Recording medium, ranking method, and information processing device

Abstract

A non-transitory computer-readable recording medium having stored therein a program for causing a computer to execute a process is provided. The process includes: generating a second characteristic model from a plurality of first characteristic models by using a maximum value and a minimum value of a prescribed parameter in the plurality of first characteristic models; executing simulation by using the second characteristic model; calculating a plurality of first margins for an evaluation item according to a result of the simulation; calculating a plurality of second margins for the evaluation item with respect to each of the first characteristic models; calculating a ratio of each of the plurality of second margins to a maximum margin of the plurality at first margins; and ranking the plurality of first characteristic models according to the ratio.

What is claimed is: 
     
       1. A non-transitory computer-readable recording medium having stored therein a program for causing a computer to execute a process comprising:
 generating a second I/O Buffer Information Specification (IBIS) characteristic model from a plurality of first IBIS characteristic models by using a maximum value and a minimum value from among maximum values and minimum values of a prescribed parameter in the respective plurality of first IBIS characteristic models, the plurality of first IBIS characteristic models respectively describing electric characteristics of a plurality of semiconductor components, the electric characteristics comprising receiver input capacitance, driver output current voltage, and driver ramp rate; 
 simulating an electric transmission line by using the second IBIS characteristic model; 
 calculating a plurality of first margins for an evaluation item according to a result of the simulating; 
 calculating a plurality of second margins for the evaluation item with respect to each of the first IBIS characteristic models by using a maximum value and a minimum value of the prescribed parameter in each of the plurality of first IBIS characteristic models; 
 calculating a ratio of each of the plurality of second margins to a maximum margin of the plurality of first margins; 
 ranking the plurality of first IBIS characteristic models according to the ratio; and 
 selecting a first IBIS characteristic model, from among the plurality of first IBIS characteristic models, that is first in the ranking, the first IBIS characteristic model corresponding to one of the plurality of semiconductor components to be used for manufacturing a product having fewer malfunctions. 
 
     
     
       2. The non-transitory computer-readable recording medium according to  claim 1 , wherein the calculating the plurality of second margins calculates a margin for the evaluation item with respect to the maximum value of the prescribed parameter in each of the plurality of first characteristic models, and a margin for the evaluation item with respect to the minimum value of the prescribed parameter in each of the first characteristic models, and sets a smaller margin from among the margin for the evaluation item with respect to the maximum value of the prescribed parameter in each of the plurality of first characteristic models, and the margin for the evaluation item with respect to the minimum value of the prescribed parameter in each of the first characteristic models, as each of the plurality of second margins for each of the plurality of first characteristic models. 
     
     
       3. The non-transitory computer-readable recording medium according to  claim 1 , wherein the executing simulation executes simulation by using, as a condition, the maximum value from among the maximum values of the prescribed parameter in the respective plurality of first characteristic models, and the minimum value from among the minimum values of the prescribed parameter in the respective plurality of first characteristic models. 
     
     
       4. A ranking method performed by an information processing device, the ranking method comprising:
 generating, by a processor, a second I/O Buffer Information Specification (IBIS) characteristic model from a plurality of first IBIS characteristic models by using a maximum value and a minimum value from among maximum values and minimum values of a prescribed parameter in the respective plurality of first IBIS characteristic models, the plurality of first IBIS characteristic models respectively describing electric characteristics of a plurality of semiconductor components, the electric characteristics comprising receiver input capacitance, driver output current voltage, and driver ramp rate; 
 simulating, by the processor, an electric transmission line by using the second IBIS characteristic model; 
 calculating, by the processor, a plurality of first margins for an evaluation item according to a result of the simulating; 
 calculating, by the processor, a plurality of second margins for the evaluation item with respect to each of the first IBIS characteristic models by using a maximum value and a minimum value of the prescribed parameter in each of the plurality of first IBIS characteristic models; 
 calculating, by the processor, a ratio of each of the plurality of second margins to a maximum margin of the plurality of first margins; 
 ranking, by the processor, the plurality of first IBIS characteristic models according to the ratio; and 
 selecting a first IBIS characteristic model, from among the plurality of first IBIS characteristic models, that is first in the ranking, the first IBIS characteristic model corresponding to one of the plurality of semiconductor components to be used for manufacturing a product having fewer malfunctions. 
 
     
     
       5. The ranking method according to  claim 4 , wherein the calculating the plurality of second margins calculates a margin for the evaluation item with respect to the maximum value of the prescribed parameter in each of the plurality of first characteristic models, and a margin for the evaluation item with respect to the minimum value of the prescribed parameter in each of the first characteristic models, and sets a smaller margin from among the margin for the evaluation item with respect to the maximum value of the prescribed parameter in each of the plurality of first characteristic models, and the margin for the evaluation item with respect to the minimum value of the prescribed parameter in each of the first characteristic models, as each of the plurality of second margins for each of the plurality of first characteristic models. 
     
     
       6. The ranking method according to  claim 4 , wherein the executing simulation executes simulation by using, as a condition, the maximum value from among the maximum values of the prescribed parameter in the respective plurality of first characteristic models, and the minimum value from among the minimum values of the prescribed parameter in the respective plurality of first characteristic models. 
     
     
       7. An information processing device comprising:
 a processor that:
 generates a second I/O Buffer Information Specification (IBIS) characteristic model from a plurality of first IBIS characteristic models by using a maximum value and a minimum value from among maximum values and minimum values of a prescribed parameter in the respective plurality of first IBIS characteristic models, the plurality of first IBIS characteristic models respectively describing electric characteristics of a plurality of semiconductor components, the electric characteristics comprising receiver input capacitance, driver output current voltage, and driver ramp rate; 
 simulating an electric transmission line by using the second IBIS characteristic model; 
 calculates a plurality of first margins for an evaluation item according to a result of the simulating; 
 calculates a plurality of second margins for the evaluation item with respect to each of the first IBIS characteristic models by using a maximum value and a minimum value of the prescribed parameter in each of the plurality of first IBIS characteristic models; 
 calculates a ratio of each of the plurality of second margins to a maximum margin of the plurality of first margins; 
 ranks the plurality of first IBIS characteristic models according to the ratio; and 
 
 selecting a first IBIS characteristic model, from among the plurality of first IBIS characteristic models, that is first in the ranking, the first IBIS characteristic model corresponding to one of the plurality of semiconductor components to be used for manufacturing a product having fewer malfunctions. 
 
     
     
       8. The information processing device according to  claim 7 , wherein the processor calculates a margin for the evaluation item with respect to the maximum value of the prescribed parameter in each of the plurality of first characteristic models, and a margin for the evaluation item with respect to the minimum value of the prescribed parameter in each of the first characteristic models, and sets a smaller margin from among the margin for the evaluation item with respect to the maximum value of the prescribed parameter in each of the plurality of first characteristic models, and the margin for the evaluation item with respect to the minimum value of the prescribed parameter in each of the first characteristic models, as each of the plurality of second margins for each of the plurality of first characteristic models. 
     
     
       9. The information processing device according to  claim 7 , wherein the processor executes simulation by using, as a condition, the maximum value from among the maximum values of the prescribed parameter in the respective plurality of first characteristic models, and the minimum value from among the minimum values of the prescribed parameter in the respective plurality of first characteristic models.