Remote test management of digital logic circuits

Abstract

Electronic devices ( 320 ) are provided which comprise a digital logic circuit ( 101 ) and a test module ( 322 ) adapted to receive test parameters from a remote test management device ( 310 ), generate test patterns based on the test parameters, apply the test patterns to the digital logic circuit, receive test responses from the digital logic circuit, compact the test responses into a test signature, and either transmit the test signature to the remote test management device or determine a test result based on a comparison of an expected signature received from the remote test management device with the test signature. Further provided are remote test management devices comprising means adapted to acquire test parameters suitable for generating test patterns for a digital logic circuit, acquire an expected signature corresponding to the test patterns, transmit the test parameters to at least one electronic device comprising the digital logic circuit, and either receive a test signature from the at least one electronic device and determine a test result based on a comparison of the expected signature with the test signature, or transmit the expected signature to the at least one electronic device.

The invention claimed is: 
     
       1. An electronic device, comprising:
 a digital logic circuit; and 
 test circuitry configured to:
 receive one or more test parameters from a remote test management device; 
 generate one or more test patterns based on the one or more test parameters; 
 apply the one or more test patterns to the digital logic circuit; 
 receive one or more test responses from the digital logic circuit; 
 compact the one or more test responses into a test signature; and 
 transmit the test signature to the remote test management device. 
 
 
     
     
       2. A mobile terminal comprising the electronic device according to  claim 1 . 
     
     
       3. The electronic device according to  claim 1 , further comprising a pseudo-random generator for generating the test patterns based on the test parameters. 
     
     
       4. The electronic device according to  claim 1 , wherein communication with the remote test management device is encrypted. 
     
     
       5. The electronic device according to  claim 1 , wherein the test circuit is configured to perform logic self-tests on the digital logic circuit. 
     
     
       6. The electronic device according to  claim 1 , wherein the one or more test parameters comprise at least one of an initialization value, a number of test patterns to be generated, and one or more sequence numbers of test patterns to be generated. 
     
     
       7. The electronic device according to  claim 1 , wherein the electronic device is one of an Integrated Circuit, a System-on-Chip, a System-in-Package and a System-on-Module. 
     
     
       8. An electronic device, comprising:
 a digital logic circuit; and 
 a test circuit configured to:
 receive one or more test parameters from a remote test management device; 
 generate one or more test patterns based on the one or more test parameters; 
 apply the one or more test patterns to the digital logic circuit; 
 receive one or more test responses from the digital logic circuit; 
 compact the one or more test responses into a test signature; 
 receive an expected signature corresponding to the one or more test patterns from the remote test management device; and 
 determine a test result based on a comparison of the expected signature with the test signature. 
 
 
     
     
       9. The electronic device according to  claim 8 , wherein the test circuit is configured to determine the test result as indicating a fault in the digital logic circuit if the expected signature differs from the test signature. 
     
     
       10. The electronic device according to  claim 8 , wherein the test circuit is configured to transmit information pertaining to the test result to the remote test management device. 
     
     
       11. The electronic device according to  claim 8 , further comprising a pseudo-random generator for generating the one or more test patterns based on the one or more test parameters. 
     
     
       12. The electronic device according to  claim 8 , wherein communication with the remote test management device is encrypted. 
     
     
       13. The electronic device according to  claim 8 , wherein the test circuit is configured to perform logic self-tests on the digital logic circuit. 
     
     
       14. The electronic device according to  claim 8 , wherein the one or more test parameters comprise at least one of an initialization value, a number of test patterns to be generated, and one or more sequence numbers of test patterns to be generated. 
     
     
       15. The electronic device according to  claim 8 , wherein the electronic device is one of an Integrated Circuit, a System-on-Chip, a System-in-Package and a System-on-Module. 
     
     
       16. A cryptographic device comprising the electronic device according to  claim 8 . 
     
     
       17. A mobile terminal comprising the cryptographic device according to  claim 16 . 
     
     
       18. A remote test management device, comprising:
 interface circuitry configured as a network interface to send and receive communications; and 
 processing circuitry operatively associated with the interface circuitry and configured to:
 acquire one or more test parameters suitable for generating one or more test patterns for a digital logic circuit; 
 acquire an expected signature corresponding to the one or more test patterns; 
 transmit the one or more test parameters to at least one electronic device comprising the digital logic circuit; 
 receive a test signature from the at least one electronic device; and 
 determine a test result based on a comparison of the expected signature with the test signature. 
 
 
     
     
       19. The remote test management device according to  claim 18 , wherein the processing circuitry is configured to determine the test result as indicating a fault in the digital logic circuit if the expected signature differs from the test signature. 
     
     
       20. The remote test management device according to  claim 18 , wherein communication with the at least one electronic device is encrypted. 
     
     
       21. The remote test management device according to  claim 18 , wherein the processing circuitry is configured to acquire the expected signature by computing the expected signature based on the one or more test parameters and a design of the digital logic circuit. 
     
     
       22. The remote test management device according to  claim 21 , wherein the one or more test parameters comprise at least one of an initialization value, a number of test patterns to be generated, and one or more sequence numbers of test patterns to be generated. 
     
     
       23. A remote test management device, comprising:
 interface circuitry configured as a network interface to send and receive communications; and 
 processing circuitry operatively associated with the interface circuitry and configured to:
 acquire one or more test parameters suitable for generating one or more test patterns for a digital logic circuit; 
 acquire an expected signature corresponding to the one or more test patterns; 
 transmit the one or more test parameters to at least one electronic device comprising the digital logic circuit; and 
 transmit the expected signature to the at least one electronic device. 
 
 
     
     
       24. The remote test management device according to  claim 23 , wherein the processing circuitry is configured to receive information pertaining to a test result for the one or more test patterns from the at least one electronic device. 
     
     
       25. The remote test management device according to  claim 23 , wherein communication with the at least one electronic device is encrypted. 
     
     
       26. The remote test management device according to  claim 23 , wherein the processing circuitry is configured to acquire the expected signature by computing the expected signature based on the one or more test parameters and a design of the digital logic circuit. 
     
     
       27. The remote test management device according to  claim 23 , wherein the one or more test parameters comprise at least one of an initialization value, a number of test patterns to be generated, and one or more sequence numbers of test patterns to be generated. 
     
     
       28. A method of testing a digital logic circuit comprised in an electronic device, the method being performed by the electronic device and comprising:
 receiving one or more test parameters from a remote test management device; 
 generating one or more test patterns based on the one or more test parameters; 
 applying the one or more test patterns to the digital logic circuit; 
 receiving one or more test responses from the digital logic circuit; 
 compacting the one or more test responses into a test signature; and 
 transmitting the test signature to the remote test management device. 
 
     
     
       29. The method according to  claim 28 , wherein communication with the remote test management device is encrypted. 
     
     
       30. The method according to  claim 28 , further comprising performing logic self-tests on the digital logic circuit. 
     
     
       31. The method according to  claim 28 , wherein the one or more test parameters comprise at least one of an initialization value, a number of test patterns to be generated, and one or more sequence numbers of test patterns to be generated. 
     
     
       32. A method of testing a digital logic circuit comprised in an electronic device, the method being performed by the electronic device and comprising:
 receiving one or more test parameters from a remote test management device; 
 generating one or more test patterns based on the one or more test parameters; 
 applying the one or more test patterns to the digital logic circuit; 
 receiving one or more test responses from the digital logic circuit; 
 compacting the one or more test responses into a test signature; 
 receiving an expected signature corresponding to the one or more test patterns from the remote test management device; and 
 determining a test result based on a comparison of the expected signature with the test signature. 
 
     
     
       33. The method according to  claim 32 , wherein the determining of a test result comprises indicating a fault in the digital logic circuit if the expected signature differs from the test signature. 
     
     
       34. The method according to  claim 32 , further comprising transmitting information pertaining to the test result to the remote test management device. 
     
     
       35. The method according to  claim 32 , wherein the one or more test patterns are generated based on the one or more test parameters using a pseudo-random generator comprised in the electronic device. 
     
     
       36. The method according to  claim 32 , wherein communication with the remote test management device is encrypted. 
     
     
       37. The method according to  claim 32 , further comprising performing logic self-tests on the digital logic circuit. 
     
     
       38. The method according to  claim 32 , wherein the one or more test parameters comprise at least one of an initialization value, a number of test patterns to be generated, and one or more sequence numbers of test patterns to be generated. 
     
     
       39. A non-transitory computer readable storage medium storing a computer program for testing a digital logic circuit comprised in an electronic device, the computer program comprising computer-executable instructions that, when executed on a processing circuit of the electronic device, causes the electronic device to:
 receive one or more test parameters from a remote test management device; 
 generate one or more test patterns based on the test parameters; 
 apply the test patterns to the digital logic circuit; 
 receive one or more test responses from the digital logic circuit; 
 compact the test responses into a test signature; and 
 transmit the test signature to the remote test management device. 
 
     
     
       40. A method of testing a digital logic circuit comprised in an electronic device, the method being performed by a remote test management device, the method comprising:
 acquiring one or more test parameters suitable for generating one or more test patterns for a digital logic circuit; 
 acquiring an expected signature corresponding to the one or more test patterns; 
 transmitting the one or more test parameters to at least one electronic device comprising the digital logic circuit; 
 receiving a test signature from the at least one electronic device; and 
 determining a test result based on a comparison of the expected signature with the test signature. 
 
     
     
       41. The method according to  claim 40 , wherein the determining of a test result comprises indicating a fault in the digital logic circuit if the expected signature differs from the test signature. 
     
     
       42. The method according to  claim 40 , wherein communication with the at least one electronic device is encrypted. 
     
     
       43. The method according to  claim 40 , wherein the acquiring of the expected signature comprises computing the expected signature based on the one or more test parameters and a design of the digital logic circuit. 
     
     
       44. The method according to  claim 40 , wherein the one or more test parameters comprise at least one of an initialization value, a number of test patterns to be generated, and one or more sequence numbers of test patterns to be generated. 
     
     
       45. A method of testing a digital logic circuit comprised in an electronic device, the method being performed by a remote test management device, the method comprising:
 acquiring one or more test parameters suitable for generating one or more test patterns for a digital logic circuit; 
 acquiring an expected signature corresponding to the one or more test patterns; 
 transmitting the one or more test parameters to at least one electronic device comprising the digital logic circuit; and 
 transmitting the expected signature to the at least one electronic device. 
 
     
     
       46. The method according to  claim 45 , further comprising receiving information pertaining to a test result for the one or more test patterns from the at least one electronic device. 
     
     
       47. The method according to  claim 45 , wherein communication with the at least one electronic device is encrypted. 
     
     
       48. The method according to  claim 45 , wherein the acquiring of the expected signature comprises computing the expected signature based on the one or more test parameters and a design of the digital logic circuit. 
     
     
       49. The method according to  claim 45 , wherein the one or more test parameters comprise at least one of an initialization value, a number of test patterns to be generated, and one or more sequence numbers of test patterns to be generated. 
     
     
       50. A non-transitory computer readable storage medium storing a computer program for testing a digital logic circuit comprised in an electronic device, the computer program comprising computer-executable instructions that, when executed on a processing circuit of a remote test management device, causes the remote test management device to:
 acquire one or more test parameters suitable for generating one or more test patterns for a digital logic circuit; 
 acquire an expected signature corresponding to the one or more test patterns; 
 transmit the one or more test parameters to at least one electronic device comprising the digital logic circuit; 
 receive a test signature from the at least one electronic device; and 
 determine a test result based on a comparison of the expected signature with the test signature.