Methods and systems for capturing the condition of a physical structure via chemical detection

Abstract

In a computer-implemented method and system for capturing the condition of a structure, the structure is scanned with a three-dimensional (3D) scanner. The 3D scanner generates 3D data. A point cloud or 3D model is constructed from the 3D data. The point cloud or 3D model is then analyzed to determine the condition of the structure.

We claim: 
     
       1. A computer-implemented method of inspecting a structure, the method comprising:
 spraying a chemical on at least part of a structure; 
 generating, via an image sensor, image data based on one or more electromagnetic (EM) waves that are emanating from the structure and that are received at the image sensor; 
 analyzing, via one or more processors, the generated image data to detect a degree of luminescence emanating from the chemical sprayed on the at least part of the structure; 
 analyzing, via the one or more processors, the detected degree of luminescence to identify a three-dimensional feature corresponding to potential damage; 
 generating, via the one or more processors, an estimation of the condition of the structure based on the three-dimensional feature identified from the detected luminescence; and 
 storing the generated estimation of the condition of the structure at one or more memory devices. 
 
     
     
       2. The method of  claim 1 , wherein spraying a chemical on at least part of a structure comprises spraying a phosphorescent chemical. 
     
     
       3. The method of  claim 1 , wherein analyzing the generated image data to detect the degree of luminescence emanating from the chemical sprayed on the at least part of the structure comprises:
 analyzing the generated image data to detect the degree of luminescence for each of a plurality of subareas of the structure. 
 
     
     
       4. The method of  claim 1 , wherein spraying the chemical on at least part of the structure comprises: spraying the chemical on a roof of the structure. 
     
     
       5. The method of  claim 4 , wherein analyzing the generated image data to detect the degree of luminescence emanating from the chemical sprayed on the at least part of the structure comprises:
 analyzing the generated image data to detect the degree of luminescence for each of a plurality of shingles on the roof. 
 
     
     
       6. The method of  claim 1 , wherein analyzing the detected degree of luminescence to identify the three-dimensional feature corresponding to potential damage comprises:
 analyzing the detected degree of luminescence to identify a crack or a crevice. 
 
     
     
       7. The method of  claim 1 , further including causing the one or more processors to calculate a financial cost estimate based on said estimation of the condition of the structure. 
     
     
       8. The method of  claim 1 , wherein analyzing the detected degree of luminescence to identify the three-dimensional feature corresponding to potential damage comprises:
 constructing, by the one or more processors, a 3D model; 
 storing the constructed 3D model at the one or more memory devices; and 
 analyzing, by the one or more processors, the 3D model to identify the three dimensional feature. 
 
     
     
       9. The method of  claim 8 , wherein generating, the estimation of the condition of the structure based on the three-dimensional feature identified from the detected degree of luminescence comprises:
 retrieving a second model from the one or more memory devices; and 
 comparing the 3D model to the second model. 
 
     
     
       10. The method of  claim 1 , wherein generating, via the image sensor, the image data based on the EM waves that are emanating from the structure and that are received at the image sensor comprises:
 generating the image data based on one or more infrared waves that are received at the image sensor; 
 generating the image data based on one or more ultraviolet waves that are received at the image sensor; or 
 some combination thereof. 
 
     
     
       11. The method of  claim 1 , further including projecting the one or more EM waves;
 wherein the one or more EM waves are subsequently reflected from the chemical. 
 
     
     
       12. The method of  claim 1 , wherein the image sensor is physically connected to a device for conveying the image sensor, the device being an aerial device or a non-aerial device; and
 wherein the method further comprises moving the device to a position where the image sensor can receive the one or more EM waves. 
 
     
     
       13. The method of  claim 12 , wherein the device includes an antenna for wirelessly receiving control commands. 
     
     
       14. A property inspection system, the property inspection system comprising:
 a chemical spraying apparatus for spraying a chemical on at least part of a structure; 
 an image sensor configured to generate image data based on one or more electromagnetic (EM) waves that are emanating from the structure and that are received at the image sensor; 
 one or more processors communicatively coupled to the image sensor, the one or more processors configured to:
 (i) analyze the image data generated by the image sensor to detect a degree of luminescence emanating from the chemical sprayed on the at least part of the structure; 
 (ii) analyze the detected degree of luminescence to identify a three-dimensional feature corresponding to potential damage; 
 (iii) generate an estimation of the condition of the structure based on the three-dimensional feature identified from the detected luminescence; and 
 (iv) storing the generated estimation of the condition of the structure at one or more memory devices communicatively connected to the processors. 
 
 
     
     
       15. The property inspection system of  claim 14 , further comprising a device for conveying for conveying the image sensor, wherein the image sensor is physically connected to the device, the device being an aerial device or a non-aerial device. 
     
     
       16. The property inspection system of  claim 15 ,
 wherein the one or more processors are further configured to cause the device to move to a position where the image sensor can receive the one or more EM waves. 
 
     
     
       17. The property inspection system of  claim 15 , wherein the device includes a control system for autonomous operation. 
     
     
       18. The property inspection system of  claim 14 , wherein the EM waves are infrared waves, and wherein the image sensor is configured to generate the image data in response to detecting the infrared waves. 
     
     
       19. The property inspection system of  claim 14 , wherein the EM waves are ultraviolet waves, and wherein the image sensor is configured to generate the image data in response to detecting the ultraviolet waves.