USD1042346SActiveUtility

Contact pin for integrated circuit testing

Assignee: JOHNSTECH INT CORPPriority: Apr 5, 2022Filed: Jun 17, 2022Granted: Sep 17, 2024
Est. expiryApr 5, 2042(~15.7 yrs left)· nominal 20-yr term from priority
79
PatentIndex Score
8
Cited by
29
References
1
Claims

Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for a contact pin for integrated circuit testing, as shown and described.

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