USD254778SExpiredUtility

Ultrasonic wave thickness meter

79
Assignee: TOKYO KEIKI KKPriority: Jul 7, 1977Filed: Jan 5, 1978Granted: Apr 22, 1980
Est. expiryJul 7, 1997(expired)· nominal 20-yr term from priority
Inventors:Toyohiko KitadaKunio IiyamaKazuyuki ItoMinoru TamuraTakanori Arioka
79
PatentIndex Score
17
Cited by
5
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for an ultrasonic wave thickness meter, as shown and described.

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