USD271568SExpiredUtility

Ultrasonic wave thickness meter

Assignee: TOKYO KEIKI KKPriority: Oct 31, 1980Filed: Mar 27, 1981Granted: Nov 29, 1983
Est. expiryOct 31, 2000(expired)· nominal 20-yr term from priority
49
PatentIndex Score
5
Cited by
11
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for an ultrasonic wave thickness meter, as shown and described.

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