USD308645SExpiredUtility

Integrated circuit tester

51
Assignee: FLUKE MFG CO JOHNPriority: Feb 26, 1987Filed: Feb 26, 1987Granted: Jun 19, 1990
Est. expiryFeb 26, 2007(expired)· nominal 20-yr term from priority
Inventors:Cheryl A. HughesEdmond C. Eng
51
PatentIndex Score
6
Cited by
10
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for an integrated circuit tester, as shown and described.

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