USD311346SExpiredUtility

Electronic test probe

Assignee: Q A TECH COMPANYPriority: Sep 25, 1987Filed: Sep 25, 1987Granted: Oct 16, 1990
Est. expirySep 25, 2007(expired)· nominal 20-yr term from priority
Inventors:Robert F. Gross
62
PatentIndex Score
14
Cited by
5
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for electronic test probe, as shown and described.

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