USD318456SExpiredUtility

Integrated circuit test clip

28
Assignee: FLUKE MFG CO JOHNPriority: Jul 24, 1987Filed: Jul 24, 1987Granted: Jul 23, 1991
Est. expiryJul 24, 2007(expired)· nominal 20-yr term from priority
Inventors:Wayne R. JonesDaniel Voss
28
PatentIndex Score
0
Cited by
9
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for an integrated circuit test clip, as shown and described.

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