USD344030SExpiredUtility

Capacitive test probe board

33
Assignee: HEWLETT PACKARD COPriority: Nov 25, 1992Filed: Nov 25, 1992Granted: Feb 8, 1994
Est. expiryNov 25, 2012(expired)· nominal 20-yr term from priority
Inventors:Ronald K. KerschnerLisa M. Kent
33
PatentIndex Score
2
Cited by
3
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for a capacitive test probe board, as shown and described.

Cited by (0)

No later patents cite this yet.

References (0)

No backward citations on record.