USD360599SExpiredUtility

Measurement scanner for semi-conductor

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Assignee: HITACHI LTDPriority: Apr 15, 1994Filed: Jul 26, 1994Granted: Jul 25, 1995
Est. expiryApr 15, 2014(expired)· nominal 20-yr term from priority
Inventors:Toshihiko WadaTadashi OhtakaNobuyoshi Hashimoto
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Claims

Claims

exact text as granted — not AI-modified
The ornamental design for a measurement scanner for semi-conductor, as shown.

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