USD457078SExpiredUtility

Offset probe thermometer

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Assignee: CHANEY INSTR COMPANYPriority: Mar 21, 2001Filed: Mar 21, 2001Granted: May 14, 2002
Est. expiryMar 21, 2021(expired)· nominal 20-yr term from priority
Inventors:Patrick J. DevlinPatricia May Koeppel
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PatentIndex Score
3
Cited by
1
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for a offset probe thermometer, as shown.

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