USD464141SExpiredUtility

Test device platform

59
Assignee: ACON LAB INCPriority: Oct 17, 2000Filed: Oct 17, 2000Granted: Oct 8, 2002
Est. expiryOct 17, 2020(expired)· nominal 20-yr term from priority
Inventors:Jim McmenamyJames Feng Lin
59
PatentIndex Score
14
Cited by
2
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for a test device platform, as shown and described.

Cited by (0)

No later patents cite this yet.

References (0)

No backward citations on record.