USD573049SActiveUtility

Testing device for electronic component

43
Assignee: HON HAI PREC IND CO LTDPriority: Nov 3, 2006Filed: Dec 28, 2006Granted: Jul 15, 2008
Est. expiryNov 3, 2026(~0.3 yrs left)· nominal 20-yr term from priority
Inventors:Chin-Feng ChenChiou-Lin FanYing HuangTay-Yang Lin
43
PatentIndex Score
5
Cited by
7
References
1
Claims

Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for a testing device for electronic component, substantially as shown and described.

Join the waitlist — get patent alerts

Track USD573049S — get alerts on status changes and closely related new filings.

We store only your email — no account needed. See our privacy policy.