USD573494SActiveUtility

Testing device for electronic component

34
Assignee: HON HAI PREC IND CO LTDPriority: Oct 11, 2006Filed: Dec 28, 2006Granted: Jul 22, 2008
Est. expiryOct 11, 2026(~0.2 yrs left)· nominal 20-yr term from priority
Inventors:Chin-Feng ChenChiou-Lin FanYing HuangTay-Yang Lin
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PatentIndex Score
2
Cited by
7
References
1
Claims

Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for a testing device for electronic component, as shown and described.

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