USD634228SActiveUtility

Electrical pin used in integrated circuit test sockets

Assignee: JOHNSTECH INTERNATPriority: Nov 3, 2009Filed: Nov 3, 2009Granted: Mar 15, 2011
Est. expiryNov 3, 2029(~3.3 yrs left)· nominal 20-yr term from priority
22
PatentIndex Score
1
Cited by
11
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for an electrical pin used in integrated circuit test sockets, as shown and described.

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