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Digital test device

56
Assignee: LI WANGPriority: Dec 23, 2009Filed: Dec 23, 2009Granted: May 15, 2012
Est. expiryDec 23, 2029(~3.4 yrs left)· nominal 20-yr term from priority
Inventors:Wang Li
56
PatentIndex Score
11
Cited by
9
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for a digital test device, as shown and described.

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