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Test fixture for scanning probe microscopy

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Assignee: HAGMANN MARK JPriority: Jan 11, 2012Filed: Jan 11, 2012Granted: Dec 17, 2013
Est. expiryJan 11, 2032(~5.5 yrs left)· nominal 20-yr term from priority
Inventors:Mark J. HagmannBoyd A. Rhoades
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6
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CLAIM 
     
       The ornamental design for a test fixture for scanning probe microscopy, as shown and described.

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