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Microscope measurement apparatus

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Assignee: HON HAI PREC IND CO LTDPriority: Jun 27, 2013Filed: Jul 29, 2013Granted: Jan 13, 2015
Est. expiryJun 27, 2033(~7 yrs left)· nominal 20-yr term from priority
Inventors:Chih-Kuang ChangLi JiangDong Li
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PatentIndex Score
3
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5
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1
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Claims

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CLAIM 
     
       The ornamental design for a microscope measurement apparatus, as shown and described.

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