USD811912SActiveUtility

Plunger for semiconductor chip-testing probe

38
Assignee: QUALMAX TESTECH INCPriority: Apr 12, 2016Filed: Oct 12, 2016Granted: Mar 6, 2018
Est. expiryApr 12, 2036(~9.7 yrs left)· nominal 20-yr term from priority
Inventors:Ki Young Jung
38
PatentIndex Score
4
Cited by
2
References
1
Claims

Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for a plunger for semiconductor chip-testing probe, as shown and described.

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