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Industrial signal testing equipment for wireless devices

66
Assignee: AMBIT MICROSYSTEMS SHANGHAIPriority: Jan 21, 2020Filed: Mar 20, 2020Granted: Apr 18, 2023
Est. expiryJan 21, 2040(~13.5 yrs left)· nominal 20-yr term from priority
Inventors:Ling ZhuJie Chen
66
PatentIndex Score
4
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20
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1
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Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for an industrial signal testing equipment for wireless devices, as shown and described.

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