USRE37485EExpiredUtility

Mass spectrometer system and method for matrix-assisted laser desorption measurements

89
Assignee: PERSEPTIVE BIOSYSTEMS INCPriority: Jul 21, 1994Filed: Mar 11, 1998Granted: Dec 25, 2001
Est. expiryJul 21, 2014(expired)· nominal 20-yr term from priority
H01J 49/0495H01J 49/0413H01J 49/40H01J 49/0418Y10T436/25875H01J 49/164Y10T436/113332Y10T436/24
89
PatentIndex Score
51
Cited by
41
References
161
Claims

Abstract

The system for analyzing multiple samples includes a plurality of portable of sample supports each for accommodating a plurality of samples thereon, and an identification mechanism for identifying each sample location on each of the plurality of sample supports. The mass spectrometer is provided for analyzing each of the plurality of samples when positioned within a sample receiving chamber, and a laser source strikes each sample with a laser pulse to desorb and ionize sample molecules. The support transport mechanism provided provides for automatically inputting and outputting each of the sample supports from the sample receiving chamber of the mass spectrometer. A vacuum lock chamber receives the sample supports and maintains at least one of the sample supports within a controlled environment while samples on another of the plurality of sample supports are being struck with laser pulses. The computer is provided for recording test data from the mass spectrometer and for controlling the operation of the system.

Claims

exact text as granted — not AI-modified
What is claimed is:  
     
       1. A system for analyzing a plurality of samples, comprising: 
       a plurality of portable sample supports each having a sample receiving surface thereon for accommodating a plurality of samples each at a fixed location on each sample support;  
       identification means for identifying each sample location of each of the plurality of samples on each of the plurality of sample supports;  
       a mass spectrometer for analyzing each of the plurality of samples on each sample support, the mass spectrometer having a sample receiving chamber therein for receiving each sample support;  
       a laser source for striking each sample on each sample support while within the receiving chamber with a laser pulse to desorb and ionize sample molecules;  
       support transfer mechanism for automatically inputting and outputting each of the sample supports from the sample receiving chamber of the mass spectrometer;  
       a powered mechanism movable in both an x direction and a y direction perpendicular to the x direction within the sample receiving chamber for supporting a respective sample support thereon;  
       a vacuum lock chamber connected to the sample receiving chamber of the mass spectrometer for receiving the sample supports and for maintaining one or more of the sample supports within a vacuum controlled environment while the plurality of samples on another of the sample supports are struck by laser pulses; and  
       computer means for recording test data from the mass spectrometer for each of the plurality of samples on the sample supports as a function of the identification means.  
     
     
       2. The system as defined in claim  1 , further comprising; 
       a sample loading mechanism for positioning each of a plurality of liquid samples on the sample receiving surface of each of the plurality of sample supports; and  
       a curing chamber for drying each of the plurality of liquid samples on each of the sample supports to form a plurality of solid samples each positioned on a respective sample support.  
     
     
       3. The system as defined in claim  2 , further comprising: 
       sample support positioning means for positioning each liquid sample on the sample receiving surface of a respective sample support.  
     
     
       4. The system as defined in claim  2 , further comprising: 
       a sample preparation mechanism for automatically preparing each of the plurality of liquid samples for a deposit on a respective sample support.  
     
     
       5. The system as defined in claim  4 , wherein the sample preparation mechanism includes a first plurality of containers for receiving respective dilutions and a second plurality of containers for receiving respective matrixes for preparing each of the plurality of liquid samples each containing a selected dilution. 
     
     
       6. The system as defined in claim  5 , further comprising: 
       valve means responsive to the computer means for automatically controlling the flow of fluids from the first and second plurality of containers.  
     
     
       7. The system as defined in claim  1 , further comprising: 
       a pump responsive to the computer means for pumping liquid samples to a respective one of the sample supports.  
     
     
       8. The system as defined in claim  7 , further comprising: 
       a drying chamber for drying liquid samples on each of the sample supports to form dried samples.  
     
     
       9. The system as defined in claim  8 , further comprising: 
       vacuum means for controlling a vacuum within the drying chamber in response to the computer means.  
     
     
       10. The system as defined in claim  1 , wherein each of the plurality of portable sample supports comprises an electrically conductive sample plate having a plurality of predetermined sample positions on the sample receiving surface. 
     
     
       11. The systems as defined in claim  10 , wherein each of the plurality of predetermined positions on the sample plate includes a well for receiving a respective sample. 
     
     
       12. The system as defined in claim  11 , wherein each of the plurality of wells on the sample plate are arranged in one of a plurality of rows and in one of a plurality of columns. 
     
     
       13. The system as defined in claim  1 , wherein: 
       the identification means includes a marking on each sample support for identifying each of the plurality of samples on the sample receiving surface.  
     
     
       14. The system as defined in claim  1 , wherein a sample support includes a magnetic handle for cooperating with the support transfer mechanism to position the sample support. 
     
     
       15. The system as defined in claim  1 , wherein each of the plurality of sample supports includes a sample holder and a plurality of pins each removably positionable with respect to the sample holder, each of the plurality of pins having a sample receiving surface thereon for receiving a respective one of the plurality of samples. 
     
     
       16. The system as defined in claim  1 , wherein each of the plurality of sample supports has one or more locating members for precisely positioning the sample support. 
     
     
       17. The system as defined in claim  1 , wherein each of the sample supports comprises in excess of 80 determined sample positions on the sample receiving surface. 
     
     
       18. The system as defined in claim  1 , further comprising; 
       sample support identification means for identifying each of the plurality of sample supports and for inputting sample support identification information to the computer means.  
     
     
       19. The system as defined in claim  1 , further comprising: 
       a sample storage chamber for storing one or more of the plurality of sample supports; and  
       a powered transporter for transporting each of the plurality of sample supports from the sample storage chamber to the vacuum lock chamber.  
     
     
       20. The system as defined in claim  19 , wherein the powered transporter is automatically responsive to the computer means. 
     
     
       21. The system as defined in claim  19 , further comprising: 
       a transport cassette for supporting a plurality of sample supports each in a preselected position within the sample storage chamber.  
     
     
       22. The system as defined in claim  21 , further comprising: 
       a transport drive mechanism for selectively positioning the transport cassette within the sample storage chamber.  
     
     
       23. The system as defined in claim  22 , wherein the transport drive mechanism is powered in response to the computer means. 
     
     
       24. The system as defined in claim  23 , wherein the transport drive mechanism comprises a lead screw and a stepper motor. 
     
     
       25. The system as defined in claim  1 , further comprising: 
       a door member for selectively controlling communication between the vacuum lock chamber and the sample receiving chamber of the mass spectrometer.  
     
     
       26. The system as defined in claim  25 , further comprising: 
       a sample storage chamber for storing one or more of the plurality of sample supports; and  
       another door member for controlling communication between vacuum lock chamber and the sample storage chamber.  
     
     
       27. The system as defined in claim  1 , further comprising: 
       a pump for selectively evacuating the vacuum lock chamber.  
     
     
       28. The system as defined in claim  1 , wherein: 
       each of the plurality of sample supports is moveable between the vacuum lock chamber and the receiving chamber of the mass spectrometer; and  
       a transporter for moving one of the plurality of samples supports within the vacuum lock chamber while the plurality of samples on another of the sample supports are being struck with laser pulses.  
     
     
       29. The system as defined in claim  1 , further comprising: 
       a powered sample support transporter for moving one or more of the plurality of sample supports within the vacuum lock chamber.  
     
     
       30. The system as defined in claim  1 , further comprising: 
       a vent valve for selectively venting the vacuum lock chamber to atmospheric pressure.  
     
     
       31. The system as defined in claim  1 , wherein the support transfer mechanism is responsive to the computer means. 
     
     
       32. The system as defined in claim  1 , wherein the support transfer mechanism includes a fluid cylinder and an actuator rod extending between the fluid cylinder and a respective sample support. 
     
     
       33. The system as defined in claim  1 , wherein: 
       each of the plurality of sample supports includes an electromagnet secured thereto; and  
       power to each electromagnet is controlled in response to the computing means.  
     
     
       34. The system as defined in claim  1 , wherein the x-y mechanism is an x-y table responsive to the computer means. 
     
     
       35. The system as defined in claim  1 , further comprising: 
       an electrically conductive block within the sample receiving chamber for receiving a respective sample support; and  
       one or more insulating members electrically insulating the powered positioning mechanism from the electrically conductive block.  
     
     
       36. The system as defined in claim  35 , further comprising: 
       a securing mechanism for temporarily affixing the position of a respective sample support with respect to the electrically conductive block.  
     
     
       37. The system as defined in claim  1 , further comprising: 
       an attenuator for adjusting the intensity of a laser beam output from the laser source.  
     
     
       38. The system as defined in claim  37 , wherein the attenuator is responsive to the computer means. 
     
     
       39. The system as defined in claim  1 , wherein the computer means interprets test data from the mass spectrometer. 
     
     
       40. A system for analyzing a plurality of samples, comprising: 
       a plurality of portable sample supports each having a sample receiving surface thereon for accommodating a plurality of samples each at a fixed location on each sample support;  
       sample identification means for identifying each sample location of each of the plurality of samples on each of the plurality of sample supports;  
       support identification means for identifying each of the plurality of sample supports; and  
       a mass spectrometer for analyzing each of the plurality of samples on a respective one of the sample supports, the mass spectrometer having a sample receiving chamber therein for receiving a respective sample support;  
       a laser source for striking each sample on each sample support while within the receiving chamber with a laser pulse to desorb and ionize sample molecules;  
       support transfer mechanism for automatically inputting and outputting each of the sample supports from the sample receiving chamber of the mass spectrometer;  
       a vacuum lock chamber connected with the sample receiving chamber of the mass spectrometer for receiving each of the sample supports and for maintaining one or more of the sample supports within a vacuum controlled environment while the plurality of samples on another of the sample supports are struck by laser pulses;  
       a sample storage chamber for storing one or more of the plurality of sample supports;  
       a powered transporter for transporting each of the plurality of sample supports from the sample storage chamber to the vacuum lock chamber; and  
       computer means for controlling the support transfer mechanism and for receiving information from the sample identification means and the support identification means for recording test data from the mass spectrometer for each of the plurality of samples on each of the sample supports.  
     
     
       41. The system as defined in claim  40  further comprising; 
       a sample loading mechanism for positioning each of a plurality of liquid samples on the sample receiving surface of each of the plurality of sample supports; and  
       a curing chamber for drying each of the plurality of liquid samples on each of the sample supports to form a plurality of solid samples each positioned on a respective sample support.  
     
     
       42. The system as defined in claim  40 , further comprising: 
       a pump responsive to the computer means for pumping liquid samples to a respective one of the sample supports.  
     
     
       43. The system as defined in claim  40 , wherein each of the plurality of portable sample supports comprises an electrically conductive sample plate having a plurality of predetermined sample positions on the sample receiving surface. 
     
     
       44. The system as defined in claim  40 , wherein: 
       the sample identification means includes a marking on each sample support for identifying each of the plurality of samples on the sample receiving surface.  
     
     
       45. The system as defined in claim  40 , wherein a sample support includes a magnetic handle for cooperating with the support transfer mechanism to position the sample support. 
     
     
       46. The system as defined in claim  40 , wherein each of the plurality of sample supports includes a sample holder and a plurality of pins each removably positionable with respect to the sample holder, each of the plurality of pins having a sample receiving surface thereon for receiving a respective one of the plurality of samples. 
     
     
       47. The system as defined in claim  40 , wherein each of the plurality of sample supports has one or more locating members for precisely positioning the sample support. 
     
     
       48. The system as defined in claim  40 , wherein each of the sample supports comprises in excess of 80 determined sample positions on the sample receiving surface. 
     
     
       49. The system as defined in claim  40 , wherein the powered transporter is automatically responsive to the computer means. 
     
     
       50. The system as defined in claim  40 , further comprising: 
       a transport cassette for supporting a plurality of sample supports each a preselected position.  
     
     
       51. The system as defined in claim  50 , further comprising: 
       a transport drive mechanism for selectively positioning the transport cassette within the storage chamber; and  
       the transport drive mechanism being powered in response to the computer means.  
     
     
       52. The system as defined in claim  40 , further comprising: 
       a door member for selectively controlling communication between the vacuum lock chamber and the sample receiving chamber of the mass spectrometer.  
     
     
       53. The system as defined in claim  52 , further comprising: 
       another door member for controlling communication between the vacuum lock chamber and the sample storage chamber.  
     
     
       54. The system as defined in claim  40 , further comprising: 
       a powered sample support transporter for moving one or more of the plurality of sample supports within the vacuum lock chamber.  
     
     
       55. The system as defined in claim  40 , wherein the support transfer mechanism includes a fluid cylinder and an actuator rod extending between the fluid cylinder and a respective sample support. 
     
     
       56. The system as defined in claim  40 , wherein: 
       each of the plurality of sample supports includes an electromagnet secured thereto; and  
       power to each electromagnet is controlled in response to the computing means.  
     
     
       57. The system as defined in claim  40 , further comprising: 
       powered positioning mechanism for selectively positioning each of the plurality of sample supports within the sample receiving chamber.  
     
     
       58. The system as defined in claim  57 , further comprising: 
       the powered positioning mechanism is an x-y table responsive to the computing means;  
       an electrically conductive block within the sample receiving chamber for receiving a respective sample support; and  
       one or more insulating members electrically insulating the powered positioning mechanism from the electrically conductive block.  
     
     
       59. The system as defined in claim  40 , further comprising: 
       an attenuator responsive to the computer means for adjusting the intensity of a laser beam output from the laser source.  
     
     
       60. A method of analyzing a plurality of samples within a sample receiving chamber of a mass spectrometer, the method comprising: 
       supporting each of a plurality of samples at a fixed location on one of a plurality of sample supports;  
       identifying each sample location of each of the plurality of samples on each of the plurality of sample supports;  
       providing a vacuum lock chamber for receiving the sample supports and for maintaining one or more of the sample supports within a vacuum controlled environment while the plurality of samples on another of the sample supports are struck by laser pulses;  
       automatically inputting and outputting each of the sample supports from the sample receiving chamber of the mass spectrometer to the vacuum lock chamber;  
       moving each sample support within the sample receiving chamber in both an x direction and a y direction perpendicular to the x direction;  
       striking each sample on each sample support while within the receiving chamber with a laser pulse to desorb and ionize sample molecules; and  
       recording test data in a computer from the mass spectrometer for each of the plurality of samples on the sample support.  
     
     
       61. The method as defined in claim  60 , further comprising; 
       positioning each of a plurality of liquid samples on the sample receiving surface of each of the plurality of sample supports; and  
       drying each of the plurality of liquid samples on each of the sample supports to form a plurality of solid samples each positioned on a respective sample support.  
     
     
       62. The method as defined in claim  61 , further comprising: 
       automatically preparing each of the plurality of liquid samples for deposit on a respective sample support.  
     
     
       63. The method as defined in claim  60 , further comprising: 
       arranging each of the plurality of samples in each sample support in a plurality of rows and in a plurality of columns.  
     
     
       64. The method as defined in claim  60 , wherein the step of identifying includes: 
       marking each sample support for identifying each of the plurality of samples.  
     
     
       65. The method as defined in claim  60 , further comprising: 
       forming in excess of 80 predetermined sample positions on each of the respective sample supports.  
     
     
       66. The method as defined in claim  60 , further comprising: 
       storing one or more of the plurality of sample supports within a sample storage chamber; and  
       automatically transporting each of the plurality of sample supports from the sample storage chamber to the vacuum lock chamber in response to the computer.  
     
     
       67. The method as defined in claim  60 , further comprising: 
       supporting each of the plurality of sample supports at a preselected position within a transport cassette.  
     
     
       68. The method as defined in claim  60 , further comprising: 
       selectively positioning the transport cassette in response to the computer.  
     
     
       69. The method as defined in claim  60 , further comprising: 
       controlling communication from within the vacuum lock chamber to the environment exterior of the vacuum lock chamber in response to the computer.  
     
     
       70. The method as defined in claim  60 , further comprising: 
       moving a sample support with the vacuum lock chamber while the plurality of samples on another of the sample supports are being struck with laser pulses.  
     
     
       71. The method as defined in claim  60 , further comprising: 
       controlling an x-y table in response to the computer for positioning the plurality of samples within the sample receiving chamber of the mass spectrometer.  
     
     
       72. The method as defined in claim  71 , further comprising: 
       supporting each of the plurality of sample supports on an electrically conductive block within the sample receiving chamber; and  
       electrically insulating the x-y table from the electrically conductive block.  
     
     
       73. The method as defined in claim  72 , further comprising: 
       temporarily affixing the position of a respective sample support with respect to the electrically conductive block.  
     
     
       74. The method as defined in claim  60 , further comprising: 
       adjusting the intensity of a laser beam output from the laser source in response to the computer.  
     
     
       75. A system for obtaining mass data comprising: 
       
         a mass spectrometer comprising an ion source chamber, wherein the ion source chamber comprises:  
       
       
         a sample receiving stage adapted to support a sample support, and  
       
       
         a mechanism to move the sample receiving stage in an x direction and in a y direction perpendicular to the x direction, wherein the x direction and the y direction lie substantially in the same plane;  
       
       
         a laser source in communication with the ion source chamber, wherein the laser source is adapted to provide a laser pulse to a sample support in the ion source chamber;  
       
       
         a vacuum lock chamber connected with the ion source chamber, wherein the vacuum lock chamber comprises a sample support holder adapted to support more than one sample support; and  
       
       
         a sample support transfer mechanism adapted to introduce a sample support from the vacuum lock chamber into the ion source chamber and to associate a sample support with the sample receiving stage;  
       
       
         wherein the sample support transfer mechanism comprises a first transfer mechanism adapted to disassociate a sample support from the sample support holder; and a second transfer mechanism adapted to introduce a sample support into association with the sample receiving stage. 
       
     
     
       76. The system of claim  75  further comprising an electronic control mechanism to control at least the mechanism to move the sample receiving stage. 
     
     
       77. The system of claim  76  wherein the electronic control mechanism comprises a computer. 
     
     
       78. The system of claim  75  wherein the laser source is adapted to provide a laser pulse to irradiate a sample on a sample support. 
     
     
       79. The system of claim  75  wherein the sample support transfer mechanism is further adapted to move a sample support from the ion source chamber to the vacuum lock chamber and into association with the sample support holder. 
     
     
       80. The system of claim  75  wherein the sample support holder comprises a cassette. 
     
     
       81. The system of claim  80  wherein the cassette is adapted to contain up to 20 sample supports. 
     
     
       82. The system of claim  75  further comprising more than one sample support adapted to support a plurality of samples each disposed at fixed locations on the sample support. 
     
     
       83. The system of claim  82  wherein at least one sample support further comprises a location identifier associated with at least one of the fixed locations. 
     
     
       84. The system of claim  83  wherein the location identifier comprises a reference marking positioned on the sample support. 
     
     
       85. The system of claim  82  wherein at least one sample support comprises a support identifier. 
     
     
       86. The system of claim  85  wherein the support identifier comprises a bar code disposed on the sample support. 
     
     
       87. The system of claim  82  wherein at least one sample support remains in the vacuum lock chamber while another sample support is in the ion source chamber. 
     
     
       88. The system of claim  87  wherein the at least one sample support in the vacuum lock chamber is supported in the sample support holder. 
     
     
       89. The system of claim  82  wherein each of the sample supports comprises a magnetic material. 
     
     
       90. The system of claim  75  further comprising a door member positioned between the ion source chamber and the vacuum lock chamber. 
     
     
       91. The system of claim  90  further comprising a vacuum pump independently associated with the vacuum lock chamber. 
     
     
       92. The system of claim  75  further comprising a sample preparation system associated with the vacuum lock chamber, wherein the sample preparation system is adapted to deliver a plurality of samples to a sample plate prior to introduction to the vacuum lock chamber. 
     
     
       93. The system of claim  92  wherein the sample preparation system comprises a sample loading mechanism adapted to position each of a plurality of liquid samples on a sample support. 
     
     
       94. The system of claim  93  wherein the sample preparation system further comprises a sample curing chamber to dry each of the plurality of liquid samples on a sample support. 
     
     
       95. A system for obtaining mass data comprising: 
       
         a mass spectrometer comprising an ion source chamber, wherein the ion source chamber comprises:  
       
       
         a sample receiving stage adapted to support a sample support, and  
       
       
         a mechanism to move the sample receiving stage in an x direction and in a y direction perpendicular to the x direction, wherein the x direction and the y direction lie substantially in the same plane;  
       
       
         a laser source in communication with the ion source chamber, wherein the laser source is adapted to provide a laser pulse to a sample support in the ion source chamber;  
       
       
         a vacuum lock chamber connected with the ion source chamber, wherein the vacuum lock chamber comprises a sample support holder adapted to support more than one sample support;  
       
       
         a sample support transfer mechanism adapted to introduce a sample support from the vacuum lock chamber into the ion source chamber and to associate a sample support with the sample receiving stage, and to dissociate a sample support from the sample receiving stage and to move a sample support from the ion source chamber to the vacuum lock chamber;  
       
       
         wherein the sample support transfer mechanism comprises a first transfer mechanism adapted to disassociate a sample support from the sample support holder; and a second transfer mechanism adapted to introduce a sample support into association with the sample receiving stage; and  
       
       
         an electronic control mechanism to control at least the mass spectrometer, the mechanism to move the sample receiving stage, and the sample support transfer mechanism. 
       
     
     
       96. The system of claim  95  wherein the electronic control mechanism comprises a computer. 
     
     
       97. The system of claim  95  wherein the electronic control mechanism is adapted to control independently the mass spectrometer, the mechanism to move the sample receiving stage, and the sample support transfer mechanism. 
     
     
       98. The system of claim  95  wherein the sample support holder comprises a cassette. 
     
     
       99. The system of claim  98  wherein the cassette is adapted to contain up to 20 sample supports. 
     
     
       100. The system of claim  95  further comprising more than one sample support adapted to support a plurality of samples each disposed at fixed locations on the sample support. 
     
     
       101. The system of claim  100  wherein at least one sample further comprises a location identifier associated with at least one of the fixed locations. 
     
     
       102. The system of claim  101  wherein the location identifier comprises a reference marking positioned on the sample support. 
     
     
       103. The system of claim  100  wherein at least one sample support comprises a support identifier. 
     
     
       104. The system of claim  103  wherein the support identifier comprises a bar code disposed on the sample support. 
     
     
       105. The system of claim  100  wherein at least one sample support remains in the vacuum lock chamber while another sample support is in the ion source chamber. 
     
     
       106. The system of claim  105  wherein the at least one sample support in the vacuum lock chamber is supported in the sample support holder. 
     
     
       107. The system of claim  100  wherein each of the sample supports comprises a magnetic material. 
     
     
       108. The system of claim  95  further comprising a door member positioned between the ion source chamber and the vacuum lock chamber. 
     
     
       109. The system of claim  108  further comprising a vacuum pump independently associated with the vacuum lock chamber. 
     
     
       110. The system of claim  95  further comprising a sample preparation system associated with the vacuum lock chamber, wherein the sample preparation system is adapted to deliver a plurality of samples to a sample plate prior to introduction to the vacuum lock chamber. 
     
     
       111. The system of claim  110  wherein the sample preparation system comprises a sample loading mechanism adapted to position each of a plurality of liquid samples on a sample support. 
     
     
       112. The system of claim  111  wherein the sample preparation system further comprises a sample curing chamber to dry each of the plurality of liquid samples on a sample support. 
     
     
       113. A system for obtaining mass data comprising: 
       
         a mass spectrometer comprising an ion source chamber, wherein the ion source chamber comprises  
       
       
         a sample receiving stage adapted to support a sample support, and  
       
       
         a mechanism to move the sample receiving stage;  
       
       
         a laser source in communication with the ion source chamber, wherein the laser source is adapted to provide a laser pulse to a sample support in the ion source chamber;  
       
       
         a vacuum lock chamber connected with the ion source chamber;  
       
       
         a sample storage chamber connected to the vacuum lock chamber, wherein the sample storage chamber comprises a sample support holder adapted to support at least one sample support; and  
       
       
         a sample support transfer mechanism adapted to move a sample support from the sample storage chamber to the vacuum lock chamber and into the ion source chamber, and to associate a sample support with the sample receiving stage;  
       
       
         wherein the sample support transfer mechanism comprises a first transfer mechanism adapted to move a sample support from the sample storage chamber to the vacuum lock chamber; and a second transfer mechanism adapted to introduce a sample support from the vacuum lock chamber into the ion source chamber. 
       
     
     
       114. The system of claim  113  wherein the mechanism to move the sample receiving stage is adapted to move the sample receiving stage in an x direction and in a y direction perpendicular to the x direction, wherein the x direction and the y direction lie substantially in the same plane. 
     
     
       115. The system of claim  113  wherein the sample support transfer mechanism is further adapted to move a sample support from the ion source chamber to the vacuum lock chamber and from the vacuum lock chamber to the sample storage chamber. 
     
     
       116. The system of claim  113  further comprising an electronic control mechanism to control at least the mechanism to move the sample receiving stage. 
     
     
       117. The system of claim  116  wherein the electronic control mechanism comprises a computer. 
     
     
       118. The system of claim  113  wherein the laser source is adapted to provide a laser pulse to irradiate a sample on a sample support. 
     
     
       119. The system of claim  113  wherein the sample support holder comprises a cassette. 
     
     
       120. The system of claim  119  wherein the cassette is adapted to contain up to  20  sample supports. 
     
     
       121. The system of claim  113  further comprising more than one sample support adapted to support a plurality of samples each disposed at fixed locations on the sample support. 
     
     
       122. The system of claim  121  wherein at least one sample further comprises a location identifier associated with at least one of the fixed locations. 
     
     
       123. The system of claim  122  wherein the location identifier comprises a reference marking positioned on the sample support. 
     
     
       124. The system of claim  122  further comprising a first door member positioned between the ion source chamber and the vacuum lock chamber. 
     
     
       125. The system of claim  124  further comprising a second door member positioned between the vacuum chamber and the sample storage chamber. 
     
     
       126. The system of claim  125  further comprising a first vacuum pump independently associated with the vacuum lock chamber. 
     
     
       127. The system of claim  126  further comprising a second vacuum pump independently associated with the sample storage chamber. 
     
     
       128. The system of claim  121  wherein at least one sample support comprises a support identifier. 
     
     
       129. The system of claim  128  wherein the support identifier comprises a bar code disposed on the sample support. 
     
     
       130. The system of claim  121  wherein at least one sample support remains in the sample support chamber while another sample support is in the ion source chamber. 
     
     
       131. The system of claim  121  wherein the at least one sample support in the vacuum lock chamber is supported in the sample support holder. 
     
     
       132. The system of claim  121  wherein each of the sample supports comprises a magnetic material. 
     
     
       133. The system of claim  113  further comprising a sample preparation system associated with the sample storage chamber, wherein the sample preparation system is adapted to deliver a plurality of samples to a sample plate prior to introduction to the sample storage chamber. 
     
     
       134. The system of claim  133  wherein the sample preparation system comprises a sample loading mechanism adapted to position each of a plurality of liquid samples on a sample support. 
     
     
       135. The system of claim  134  wherein the sample preparation system further comprises a sample curing chamber to dry each of the plurality of liquid samples on a sample support. 
     
     
       136. A system for obtaining mass data comprising: 
       
         a mass spectrometer comprising an ion source chamber, wherein the ion source chamber comprises:  
       
       
         a sample receiving stage adapted to support a sample support, and  
       
       
         a mechanism to move the sample receiving stage;  
       
       
         a laser source in communication with the ion source chamber, wherein the laser source is adapted to provide a laser pulse to a sample support in the ion source chamber;  
       
       
         a vacuum lock chamber connected with the ion source chamber;  
       
       
         a sample storage chamber connected to the vacuum lock chamber, wherein the sample storage chamber comprises a sample support holder adapted to support at least one sample support;  
       
       
         a first sample support transfer mechanism adapted to move a sample support from the sample storage chamber to the vacuum lock chamber;  
       
       
         a second sample support transfer mechanism adapted to move a sample support from the vacuum lock chamber and into the ion source chamber, and to associate a sample support with the sample receiving stage; and  
       
       
         an electronic control mechanism to control at least the mechanism to move the sample receiving stage, the first sample support transfer mechanism, and the second sample support transfer mechanism. 
       
     
     
       137. The system of claim  136  wherein the mechanism to move the sample receiving stage is adapted to move the sample receiving stage in an x direction and in a y direction perpendicular to the x direction, wherein the x direction and the y direction lie substantially in the same plane. 
     
     
       138. The system of claim  136  wherein the second sample support transfer mechanism is further adapted to move a sample support from the ion source chamber to the vacuum lock chamber and the first sample support transfer mechanism is further adapted to move a sample support from the vacuum lock chamber to the sample storage chamber. 
     
     
       139. The system of claim  136  wherein the electronic control mechanism comprises a computer. 
     
     
       140. The system of claim  136  wherein the electronic control mechanism is adapted to control independently the mechanism to move the sample receiving stage, the first sample support transfer mechanism, and the second sample support transfer mechanism. 
     
     
       141. The system of claim  136  wherein the laser source is adapted to provide a laser pulse to irradiate a sample on a sample support. 
     
     
       142. The system of claim  136  wherein the sample support holder comprises a cassette. 
     
     
       143. The system of claim  142  wherein the cassette is adapted to contain up to 20 sample supports. 
     
     
       144. The system of claim  136  further comprising more than one sample support adapted to support a plurality of samples each disposed at fixed locations on the sample support. 
     
     
       145. The system of claim  144  wherein at least one sample support further comprises a location identifier associated with at least one of the fixed locations. 
     
     
       146. The system of claim  145  wherein the location identifier comprises a reference marking positioned on the sample support. 
     
     
       147. The system of claim  144  wherein at least one sample support comprises a support identifier. 
     
     
       148. The system of claim  147  wherein the support identifier comprises a bar code disposed on the sample support. 
     
     
       149. The system of claim  144  wherein at least one sample support remains in the sample storage chamber while another sample support is in the ion source chamber. 
     
     
       150. The system of claim  144  wherein the at least one sample support in the vacuum lock chamber is supported in the sample support holder. 
     
     
       151. The system of claim  144  wherein each of the sample supports comprises a magnetic material. 
     
     
       152. The system of claim  136  further comprising a first door member positioned between the ion source chamber and the vacuum lock chamber. 
     
     
       153. The system of claim  152  further comprising a second door member positioned between the vacuum chamber and the sample storage chamber. 
     
     
       154. The system of claim  153  further comprising a first vacuum pump independently associated with the vacuum lock chamber. 
     
     
       155. The system of claim  154  further comprising a second vacuum pump independently associated with the sample storage chamber. 
     
     
       156. The system of claim  136  further comprising a sample preparation system associated with the sample storage chamber, wherein the sample preparation system is adapted to deliver a plurality of samples to a sample plate prior to introduction to the sample storage chamber. 
     
     
       157. The system of claim  156  wherein the sample preparation system comprises a sample loading mechanism adapted to position each of a plurality of liquid samples on a sample support. 
     
     
       158. The system of claim  157  wherein the sample preparation system further comprises a sample curing chamber to dry each of the plurality of liquid samples on a sample support. 
     
     
       159. A method of obtaining mass data comprising the steps of: 
       
         supporting each of a plurality of samples at a fixed location on one of a plurality of sample supports;  
       
       
         providing a vacuum lock chamber to receive the plurality of sample supports and to maintain one or more of the sample supports within a vacuum controlled environment while the plurality of samples on another of the sample supports are struck by laser pulses;  
       
       
         inputting and outputting individually a desired number of the plurality of sample supports between a sample support holder and the vacuum lock chamber with a first transfer mechanism;  
       
       
         inputting and outputting individually a desired number of the plurality of sample supports between the vacuum lock chamber and an ion source chamber of a mass spectrometer with a second transfer mechanism;  
       
       
         moving each sample support within the ion source chamber in an x direction and a y direction perpendicular to the x direction; and  
       
       
         striking with a laser pulse a desired number of the plurality of samples on each sample support within the ion source chamber to desorb and ionize sample molecules. 
       
     
     
       160. The method of claim  159  further comprising the step of: 
       
         recording in a computer mass data corresponding to each of the plurality of samples struck with a laser pulse. 
       
     
     
       161. The method of claim  159  further comprising the step of: 
       
         introducing the plurality of sample supports into a sample storage chamber connected with the vacuum lock chamber, wherein a desired number of the plurality of sample supports are moved from the sample support chamber to the vacuum lock chamber.

Cited by (0)

No later patents cite this yet.

References (0)

No backward citations on record.