Multideflector

Abstract

A method and apparatus to direct ions away from their otherwise intended or parallel course. Deflectors are used to establish electric fields in regions through which ions are to pass. With such electric fields, ions may be deflected to a desired trajectory. According to the present invention, a multideflector, in the form of a series of bipolar plates spaced evenly across the ion beam path, is used as an ion deflector.

1. An improved time of flight mass spectrometer comprising:
 a deflector for deflecting an ion from an ion path consisting of more than two plates arranged across said ion path in such a way that, during a given passage through said deflector, said ion must pass between two and only two adjacent plates; and  
 a detector for detecting said ion;  
 wherein each of said plates is energized to a potential.  
 
     
     
       2. An improved time of flight mass spectrometer according to  claim 1  wherein said deflector is formed by a series of conductive plates. 
     
     
       3. An improved time of flight mass spectrometer according to  claim 2  wherein at least one of said conductive plates is metallic. 
     
     
       4. An improved time of flight mass spectrometer according to  claim 1  wherein said deflector deflects substantially all ions away from said ion path. 
     
     
       5. An improved time of flight mass spectrometer according to  claim 1  wherein said detector is responsive to the number of ions not deflected away from said ion path. 
     
     
       6. An improved time of flight mass spectrometer according to  claim 1  wherein said ions are deflected away from said ion path along a plurality of directions. 
     
     
       7. An improved time of flight mass spectrometer according to  claim 6  wherein said mass deflector is formed by a series of conductive plates. 
     
     
       8. An improved time of flight mass spectrometer according to  claim 1  wherein said deflector is used as a mass selector. 
     
     
       9. An improved time of flight mass spectrometer according to  claim 1  wherein at least one of said plates is energized to a positive potential and another of said plates is energized to a negative potential. 
     
     
       10. A multideflector for analyzing ions in a time of flight mass spectrometer comprising:
 an ion source;  
 an ion detector;  
 a flight tube for transporting ions formed within said ion source; and  
 a gate disposed along said flight tube;  
 wherein said ion source produces ions capable of travel along said flight tube, and wherein said detector detects the presence of said ions; and  
 wherein said gate is formed by a series of metal plates arranged across said flight tube in such a way that, during a given passage through said multideflector, said ions must pass between two and only two adjacent plates, said plates being aligned to deflect substantially all ions away from the direction of ion propagation along said flight tube.  
 
     
     
       11. A multideflector according to  claim 10  wherein at least one of said plates is conductive. 
     
     
       12. A multideflector according to  claim 11  wherein at least one of said conductive plates is metallic. 
     
     
       13. A multideflector according to  claim 10  wherein said gate deflects said ions into a plurality of directions. 
     
     
       14. A multideflector according to  claim 10  wherein said ion source includes a laser. 
     
     
       15. A multideflector according to  claim 10  wherein a data acquisition system is used to measure the time of flight of ions from said ion source to said detector. 
     
     
       16. A multideflector according to  claim 15  wherein a multiplicity of detectors are used. 
     
     
       17. A multideflector according to  claim 10  wherein a reflector is used to alter the path of ions away from said direction of propagation. 
     
     
       18. A multideflector according to  claim 10  wherein a gate is used to select ions based on mass. 
     
     
       19. A mass selector for use in a time of flight instrument comprising:
 a flight tube;  
 a gate; and  
 an ion source;  
 wherein said ion source produces ions that travel through said flight tube, and wherein said gate impedes the travel of said ions by deflecting said ions into at least two directions.  
 
     
     
       20. A mass selector according to  claim 19  wherein said gate is formed of a plurality of metal plates, of which at least one of said metallic plates is energized. 
     
     
       21. A mass selector according to  claim 19  which includes a computer controller. 
     
     
       22. A mass selector according to  claim 21  wherein said computer controller includes means to vary voltages applied to said gate. 
     
     
       23. An improved time of flight mass spectrometer comprising:
   a multideflector for deflecting ions from an ion path consisting of more than two bipolar deflection plates each comprising a pair of metal plates separated from one another by an insulator, said bipolar deflection plates being arranged across said ion path in such a way that, during a given passage through said multideflector, each of said ions must pass between two and only two adjacent bipolar deflection plates; and        a detector for detecting said ions;        wherein each of said metal plates is energized to a potential and the potentials of the metal plates of each pair have opposite polarities.     
     
     
       24. An improved time of flight mass spectrometer according to  claim 23  wherein the total thickness of each bipolar plate is in order of  0 . 1  mm. 
     
     
       25. An improved time of flight mass spectrometer according to  claim 23  wherein the insulator consists of polyamide layer. 
     
     
       26. An improved time of flight mass spectrometer according to  claim 24  wherein the insulator consists of polyamide layer. 
     
     
       27. An improved time of flight mass spectrometer according to  claim 23  wherein the bipolar deflection plates are curved. 
     
     
       28. An improved time of flight mass spectrometer according to  claim 24  wherein the bipolar deflection plates are curved. 
     
     
       29. An improved time of flight mass spectrometer according to  claim 25  wherein the bipolar deflection plates are curved. 
     
     
       30. An improved time of flight mass spectrometer according to  claim 26  wherein the bipolar deflection plates are curved. 
     
     
       31. An improved time of flight mass spectrometer according to  claim 23  wherein the bipolar deflection plates are placed adjacent and parallel to one another such that each metal plate of every bipolar deflection plate is facing the metal plate of the adjacent bipolar deflection plate which has the opposite polarity. 
     
     
       32. An improved time of flight mass spectrometer according to  claim 31  wherein the distance between adjacent bipolar deflection plates is a constant. 
     
     
       33. An improved time of flight mass spectrometer according to  claim 32  wherein the bipolar deflection plates are curved. 
     
     
       34. An improved time of flight mass spectrometer according to  claim 31  wherein the distance between adjacent bipolar deflection plates varies as a function of position within the multideflector. 
     
     
       35. An improved time of flight mass spectrometer according to  claim 34  wherein the bipolar deflection plates are curved. 
     
     
       36. An improved time of flight mass spectrometer according to  claim 23  wherein the potentials on the conducting electrodes is held constant. 
     
     
       37. An improved time of flight mass spectrometer according to  claim 23  wherein the potentials on the conducting electrodes is varied as a function of time. 
     
     
       38. An improved time of flight mass spectrometer according to  claim 32  wherein the potentials on the conducting electrodes is held constant. 
     
     
       39. An improved time of flight mass spectrometer according to  claim 32  wherein the potentials on the conducting electrodes is varied as a function of time. 
     
     
       40. An improved time of flight spectrometer according to  claim 1  wherein said deflector deflects substantially all ions from one ion path to a second ion path.