Probe for ultrasonic diagnostic apparatus

Abstract

The present disclosure provides a probe for an ultrasonic diagnostic apparatus. The probe includes a backing layer, a piezoelectric layer disposed on one side of the backing layer, a matching layer disposed on one side of the piezoelectric layer, a signal connector disposed inside the backing layer to transfer a signal to the piezoelectric layer, and a ground connector disposed outside the signal connector. The backing layer, the piezoelectric layer and the matching layer are sequentially disposed and the signal connector is electrically connected to the piezoelectric layer at the other side of the piezoelectric layer. The probe for an ultrasonic diagnostic apparatus includes a stack of the backing layer, the piezoelectric layer and the matching layer, in which the piezoelectric layer is formed to have a certain curvature, thereby achieving performance improvement through minimization of interference from a signal connector and a ground connector.

What is claimed is: 
     
       1. A probe for an ultrasonic diagnostic apparatus, comprising:
 a backing layer; 
 a piezoelectric layer disposed on one side of the backing layer; 
 a matching layer disposed on one side of the piezoelectric layer; 
 a signal connector disposed inside the backing layer to transfer a signal to the piezoelectric layer; and 
 a ground connector disposed outside the signal connector, 
 wherein the backing layer, the piezoelectric layer and the matching layer are sequentially disposed and the signal connector is electrically connected to the piezoelectric layer at the other side of the piezoelectric layer, 
 wherein the backing layer is provided with backing layer electrodes including a first backing layer electrode and a second backing layer electrodes electrode, the piezoelectric layer is provided with a first piezoelectric layer electrode contacting the first backing layer electrodes and a second piezoelectric layer electrode, the matching layer is provided with a matching layer electrode contacting the second piezoelectric layer electrode and the second backing layer electrode, and an insulator is provided between the backing layer electrodes to divide the backing layer electrodes into the first backing layer electrode and the second backing layer electrodes electrode, 
 wherein the first piezoelectric layer electrode contacts the first backing layer electrode, 
 wherein the signal connector is connected to the first backing layer electrode, and the ground connector are is connected to the first and second backing layer electrodes, respectively electrode, the signal connector and the ground connector being disposed inside the backing layer and extending in a different direction than a direction of the piezoelectric layer. 
 
     
     
       2. The probe according to  claim 1 , wherein the piezoelectric layer comprises a convex piezoelectric portion convexly formed towards the piezoelectric backing layer. 
     
     
       3. The probe according to  claim 2 , wherein the matching layer comprises a convex matching portion convexly formed corresponding to a shape of the convex piezoelectric portion. 
     
     
       4. The probe according to  claim 3 , further comprising: a lens disposed outside the matching layer and formed at one side thereof of the lens with a lens convex portion convexly formed corresponding to a shape of the convex matching portion. 
     
     
       5. The probe according to  claim 4 , wherein the other side of the lens opposite the lens convex portion is a planar surface. 
     
     
       6. The probe according to  claim 4 , wherein the other side of the lens opposite the lens convex portion is convex in a different direction from the lens convex portion. 
     
     
       7. The probe according to  claim 1 , wherein the signal connector and the ground connector are disposed only inside the backing layer.