USRE48877EActiveUtilityPatentIndex 62
Multi-layer ceramic capacitor and method of manufacturing the same
Est. expiryMar 30, 2032(~5.7 yrs left)· nominal 20-yr term from priority
C04B 2235/72C04B 2235/3262C04B 2235/3239C04B 2235/3236C04B 2235/3224C04B 2235/5445C04B 2235/3206C04B 2235/784C04B 2235/785C04B 2235/6584C04B 2235/3244C04B 2235/3418C04B 2235/5454H01G 4/248C04B 35/465C04B 35/4682H01G 4/1227H01G 4/30H01G 4/1209H01G 4/012
62
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Claims
Abstract
A multi-layer ceramic capacitor has a structure where the dispersion, nd, of average grain size of the dielectric grains constituting the dielectric layer (a value (D90/D10) obtained by dividing D90 which is a grain size including 90% cumulative abundance of grains by D10 which is a grain size including 10% cumulative abundance of grains) is smaller than 4.
Claims
exact text as granted — not AI-modifiedThe invention claimed is:
1. A multi-layer ceramic capacitor constituted by sintered dielectric layers and internal electrode layers alternately layered with one another, wherein dielectric grains constitute a sintered grain body which forms the sintered dielectric layers, and a dispersion, nd, of average grain size of the dielectric grains (a value (D90/D10) obtained by dividing D90 which is a grain size including 90% cumulative abundance of grains by D10 which is a grain size including 10% cumulative abundance of grains) is smaller than 4, said dielectric grains being sintered and grown to wherein an average size of sintered grains in the sintered grain body is greater than 300 nm but smaller than 1000 nm.
2. A multi-layer ceramic capacitor according to claim 1 , wherein the dielectric layer does not contain Mg.
3. A multi-layer ceramic capacitor according to claim 2 , wherein an average of the dielectric grains is greater than 300 nm but smaller than 100 nm.
4. A multi-layer ceramic capacitor according to claim 1 , wherein the dielectric layer contains 0.03 mol or less of Mg per 100 mol of BaTiO 3 .
5. A multi-layer ceramic capacitor according to claim 4 , wherein the dielectric layer contains 0.01 mol or more but 0.03 mol or less of Mg per 100 mol of BaTiO 3 .
6. A multi-layer ceramic capacitor according to claim 5 , wherein an average size of the dielectric grains is greater than 300 nm but smaller than 1000 nm.
7. A multi-layer ceramic capacitor according to claim 4 , wherein an average size of the dielectric grains is greater than 300 nm but smaller than 1000 nm.
8. A multi-layer ceramic capacitor according to claim 1 , wherein the multi-layer ceramic capacitor has an accelerated life of 25 hours or longer as measured by an accelerated life test conducted under conditions of 150° C. and 8.5 V/μm.
9. A multi-layer ceramic capacitor according to claim 1 , wherein the multi-layer ceramic capacitor has a specific dielectric constant of 5000 or greater.
10. A method of manufacturing a multi-layer ceramic capacitor comprising:
a step to prepare a dielectric material powder whose average grain size is 200 nm or less, and
a step to sinter the dielectric material powder in such a way that a dispersion of average grain size nd (grain size D90 equivalent to 90% cumulative abundance divided by grain size D10 equivalent to 10% cumulative abundance (D90/D10)) of dielectric grains constituting a dielectric layer becomes smaller than 4, and an average size of the dielectric grains becomes greater than 300 nm but smaller than 1000 nm.
11. A method of manufacturing multi-layer ceramic capacitor according to claim 10 , wherein an average grain size of the dielectric material powder is 80 nm or greater but 200 nm or smaller.Cited by (0)
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