Security enhancement of customer replaceable unit monitor (CRUM)

Abstract

A component subsystem and a method for authenticating the component subsystem. The component subsystem may be installed in a host device. The method can include an authentication protocol, wherein the host device sends a test voltage value to the component subsystem which, in turn, generates a test voltage based on the test voltage value. The test voltage is applied to a test cell that includes a wordline, a bitline, and a memory film. A response voltage is read from the bitline and compared to an expected value. If the response voltage matches the expected value, host device and/or component subsystem functionality is enabled. If the response voltage does not match the expected value, the host device and/or component subsystem functionality is disabled.

The invention claimed is: 
     
       1. A method for authenticating a component subsystem, comprising:
 installing the component subsystem into a host device; 
 selecting a test voltage value using a test value selection protocol within the host device; 
 sending the test voltage value to the component subsystem from the host device; 
 applying an input voltage to a test cell comprising a memory material, wherein the input voltage is based on the test voltage value; 
 reading a response voltage from the test cell, wherein the response voltage results from the input voltage applied to the test cell and a voltage hysteresis created by the memory material between the input voltage and the response voltage; 
 sending the response voltage to the host device from the component subsystem; 
 comparing the response voltage to an expected output voltage using a host controller within the host device; and 
 enabling functionality of the component subsystem in response to the response voltage matching the expected output voltage. 
 
     
     
       2. The method of  claim 1 , further comprising disabling functionality of the component subsystem in response to the response voltage not matching the expected output voltage. 
     
     
       3. The method of  claim 1 , further comprising:
 applying the input voltage to a the memory film material within the test cell, wherein the memory film material is a material selected from the group consisting of viz. polyvinylidene fluoride, polyvinylidene with one or more polyvinylidene copolymers, a ter polymer based on a copolymer, a ter polymer based on PVDF-trifluoroethylene, an odd-numbered nylon, an odd-numbered nylon with any odd-numbered nylon copolymer, a cyanopolymer, and a cyanopolymer with a cyanopolymer copolymer. 
 
     
     
       4. The method of  claim 1 , further comprising:
 sending the test value to the component subsystem from the host device using a first wireless signal on a wireless data bus; and 
 sending the response voltage to the host device from the component subsystem using a second wireless signal on the wireless data bus. 
 
     
     
       5. The method of  claim 4 , wherein the first wireless signal and the second wireless signal are encrypted. 
     
     
       6. The method of  claim 1 , wherein the host device is a printer and the component subsystem is one of an ink cartridge, a toner cartridge, a xerographic module, and a fuser assembly. 
     
     
       7. An electronic system, comprising: a host device; a A component subsystem installed installable in the a host device, wherein the component subsystem comprises comprising:
 an authentication module configured to receive a test voltage value from a host device and to output a test an input voltage; and 
 a test cell configured to receive the test input voltage output by the authentication module, the test cell comprising a wordline, a bitline, and a memory film material, the memory film material is interposed between the wordline and the bitline, wherein the test cell is configured to output a response voltage in response to receiving the test input voltage; and a host controller configured to compare the response voltage to an expected voltage based on the test voltage value. 
 
     
     
       8. The electronic system of  claim 7 , wherein the host controller is configured to disable functionality of the host device when the response voltage varies from the expected voltage by more than an allowable tolerance. 
     
     
       9. The electronic system of  claim 8 , wherein the host controller is configured to enable functionality of the host device when the response voltage matches the expected voltage. 
     
     
       10. The electronic system of  claim 7 , wherein the memory film is a material selected from the group consisting of viz. polyvinylidene fluoride, polyvinylidene with one or more polyvinylidene copolymers, a ter polymer based on a copolymer, a ter polymerbased on PVDF-trifluoroethylene, an odd-numbered nylon, an odd-numbered nylon with any odd-numbered nylon copolymer, a cyanopolymer, and a cyanopolymer with a cyanopolymer copolymer. 
     
     
       11. The electronic system of  claim 7 , further comprising a wireless data bus between the host device and the component subsystem, wherein the electronic system is configured to transmit the test voltage value from the host device to the component subsystem over the wireless data bus, and is further configured to transmit the response voltage from the component subsystem to the host device over the wireless data bus. 
     
     
       12. The component subsystem of  claim 11 , wherein the host device and the component subsystem are configured to output encrypted data on the wireless data bus. 
     
     
       13. A printer, comprising:
 a host device; 
 a component subsystem installed in the host device, wherein the component subsystem comprises:
 an authentication module configured to receive a test voltage value and to output a test an input voltage; and 
 a test cell configured to receive the test input voltage output by the authentication module, the test cell comprising a wordline, a bitline, and a memory film material, the memory film material is interposed between the wordline and the bitline, wherein the test cell is configured to output a response voltage in response to receiving the test input voltage; 
 
 a host controller configured to compare the response voltage to an expected voltage based on the test voltage value; and 
 a housing that encases the component subsystem. 
 
     
     
       14. The printer of  claim 13 , wherein the host controller is configured to disable functionality of the host device when the response voltage varies from the expected voltage by more than an allowable tolerance. 
     
     
       15. The printer of  claim 14 , wherein the host controller is configured to enable functionality of the host device when the response voltage matches the expected voltage. 
     
     
       16. The printer of claim  13  15, wherein the memory film material is a material selected from the group consisting of viz. polyvinylidene fluoride, polyvinylidene with one or more polyvinylidene copolymers, a ter polymer based on a copolymer, a ter polymerbased on PVDF-trifluoroethylene, an odd-numbered nylon, an odd-numbered nylon with any odd-numbered nylon copolymer, a cyanopolymer, and a cyanopolymer with a cyanopolymer copolymer. 
     
     
       17. The printer of  claim 13 , further comprising a wireless data bus between the host device and the component subsystem, wherein the component subsystem is configured to transmit the test voltage value from the host device to the component subsystem over the wireless data bus, and is further configured to transmit the response voltage from the component subsystem to the host device over the wireless data bus. 
     
     
       18. The printer of  claim 17 , wherein the host device and the component subsystem are configured to output encrypted data on the wireless data bus. 
     
     
       19. The printer of  claim 13 , wherein the component subsystem is one of an ink cartridge, a toner cartridge, a xerographic module, and a fuser assembly. 
     
     
       20. The electronic system component subsystem of  claim 7 , wherein:
 the authentication module comprises an authentication module controller; and 
 the authentication module controller comprises an anti-cloning mechanism. 
 
     
     
       21. An electronic system, comprising:
 a host device;   a component subsystem installed in the host device, wherein the component subsystem comprises:
 an authentication module configured to receive a test voltage value and to output an input voltage; and 
 a test cell configured to receive the input voltage output by the authentication module, the test cell comprising a wordline, a bitline, and a memory material, the memory material is interposed between the wordline and the bitline, wherein the test cell is configured to output a response voltage in response to receiving the input voltage; and 
   a host controller configured to compare the response voltage to an expected voltage based on the test voltage value.   
     
     
       22. The electronic system of claim 21, wherein the host controller is configured to disable functionality of the host device when the response voltage varies from the expected voltage by more than an allowable tolerance. 
     
     
       23. The electronic system of claim 22, wherein the host controller is configured to enable functionality of the host device when the response voltage matches the expected voltage. 
     
     
       24. The electronic system of claim 21, wherein the memory material is a material selected from the group consisting of viz. polyvinylidene fluoride, polyvinylidene with one or more polyvinylidene copolymers, a ter polymer based on a copolymer, a ter polymerbased on PVDF-trifluoroethylene, an odd-numbered nylon, an odd-numbered nylon with any odd-numbered nylon copolymer, a cyanopolymer, and a cyanopolymer with a cyanopolymer copolymer. 
     
     
       25. The electronic system of claim 21, further comprising a wireless data bus between the host device and the component subsystem, wherein the electronic system is configured to transmit the test voltage value from the host device to the component subsystem over the wireless data bus, and is further configured to transmit the response voltage from the component subsystem to the host device over the wireless data bus. 
     
     
       26. The component subsystem of claim 25, wherein the host device and the component subsystem are configured to output encrypted data on the wireless data bus. 
     
     
       27. The electronic system of claim 21, wherein:
 the authentication module comprises an authentication module controller; and   the authentication module controller comprises an anticloning mechanism.