P

Assignee

CYBEROPTICS CORP

US73 patents

Top patents by PatentIndex Score

US6538244B1Mar 25, 2003

Pick and place machine with improved vision system including a linescan sensor

CYBEROPTICS CORP78 citations98
US6549647B1Apr 15, 2003

Inspection system with vibration resistant video capture

CYBEROPTICS CORP82 citations97
US4733969AMar 29, 1988

Laser probe for determining distance

CYBEROPTICS CORP275 citations97
US6577405B2Jun 10, 2003

Phase profilometry system with telecentric projector

CYBEROPTICS CORP70 citations96
US5278634AJan 11, 1994

High precision component alignment sensor system

CYBEROPTICS CORP122 citations96
US5005978AApr 9, 1991

Apparatus and method for the noncontact measurement of drill diameter, runout, and tip position

CYBEROPTICS CORP57 citations96
US6590658B2Jul 8, 2003

Optical alignment system

CYBEROPTICS CORP91 citations95
US5897611AApr 27, 1999

High precision semiconductor component alignment systems

CYBEROPTICS CORP72 citations94
US6610991B1Aug 26, 2003

Electronics assembly apparatus with stereo vision linescan sensor

CYBEROPTICS CORP22 citations93
US6608320B1Aug 19, 2003

Electronics assembly apparatus with height sensing sensor

CYBEROPTICS CORP35 citations93
US5293048AMar 8, 1994

Laser sensor for detecting the presence of an object in continuous motion

CYBEROPTICS CORP41 citations93
US7027639B2Apr 11, 2006

High speed optical image acquisition system with extended dynamic range

CYBEROPTICS CORP24 citations92
US6750899B1Jun 15, 2004

Solder paste inspection system

CYBEROPTICS CORP38 citations92
US6744499B2Jun 1, 2004

Calibration methods for placement machines incorporating on-head linescan sensing

CYBEROPTICS CORP23 citations92
US6583884B2Jun 24, 2003

Tomographic reconstruction of electronic components from shadow image sensor data

CYBEROPTICS CORP31 citations92
US6490048B1Dec 3, 2002

Tomographic reconstruction of electronic components from shadow image sensor data

CYBEROPTICS CORP24 citations92
US6118538ASep 12, 2000

Method and apparatus for electronic component lead measurement using light based sensors on a component placement machine

CYBEROPTICS CORP40 citations92
US6049384AApr 11, 2000

Method and apparatus for three dimensional imaging using multi-phased structured light

CYBEROPTICS CORP38 citations92
US5519204AMay 21, 1996

Method and apparatus for exposure control in light-based measurement instruments

CYBEROPTICS CORP30 citations92
US5331406AJul 19, 1994

Multi-beam laser sensor for semiconductor lead measurements

CYBEROPTICS CORP36 citations92
US5309223AMay 3, 1994

Laser-based semiconductor lead measurement system

CYBEROPTICS CORP48 citations92
US4872747AOct 10, 1989

Use of prisms to obtain anamorphic magnification

CYBEROPTICS CORP54 citations92
US7813559B2Oct 12, 2010

Image analysis for pick and place machines with in situ component placement inspection

CYBEROPTICS CORP24 citations91
US6538750B1Mar 25, 2003

Rotary sensor system with a single detector

CYBEROPTICS CORP33 citations91
USRE38025EMar 11, 2003

High precision component alignment sensor system

CYBEROPTICS CORP25 citations91
US6292261B1Sep 18, 2001

Rotary sensor system with at least two detectors

CYBEROPTICS CORP27 citations91
US4891772AJan 2, 1990

Point and line range sensors

CYBEROPTICS CORP45 citations91
US6353478B1Mar 5, 2002

Digital range sensor system

CYBEROPTICS CORP16 citations90
US6288786B1Sep 11, 2001

Digital range sensor system

CYBEROPTICS CORP19 citations90
US6195165B1Feb 27, 2001

Enhanced sensor

CYBEROPTICS CORP73 citations90
US7239399B2Jul 3, 2007

Pick and place machine with component placement inspection

CYBEROPTICS CORP45 citations89
US6762847B2Jul 13, 2004

Laser align sensor with sequencing light sources

CYBEROPTICS CORP43 citations89
US6678062B2Jan 13, 2004

Automated system with improved height sensing

CYBEROPTICS CORP52 citations89
US10126252B2Nov 13, 2018

Enhanced illumination control for three-dimensional imaging

CYBEROPTICS CORP7 citations83
US9816287B2Nov 14, 2017

Updating calibration of a three-dimensional measurement system

CYBEROPTICS CORP8 citations83
US6535291B1Mar 18, 2003

Calibration methods for placement machines incorporating on-head linescan sensing

CYBEROPTICS CORP13 citations83
US7545514B2Jun 9, 2009

Pick and place machine with improved component pick image processing

CYBEROPTICS CORP11 citations82
US7369334B2May 6, 2008

Optical device with alignment compensation

CYBEROPTICS CORP18 citations82
US7706595B2Apr 27, 2010

Pick and place machine with workpiece motion inspection

CYBEROPTICS CORP19 citations81
US7559134B2Jul 14, 2009

Pick and place machine with improved component placement inspection

CYBEROPTICS CORP19 citations81
US6049740AApr 11, 2000

Printed circuit board testing system with page scanner

CYBEROPTICS CORP16 citations80
US7746481B2Jun 29, 2010

Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beam

CYBEROPTICS CORP18 citations79
US6825486B1Nov 30, 2004

System for mapping wafers using predictive dynamic lighting

CYBEROPTICS CORP14 citations76
US5821527AOct 13, 1998

Method and apparatus for exposure control in light-based measurement instruments

CYBEROPTICS CORP6 citations74
US5665958ASep 9, 1997

Method and apparatus for exposure control in light-based measurement instruments

CYBEROPTICS CORP8 citations74
US10346963B2Jul 9, 2019

Point cloud merging from multiple cameras and sources in three-dimensional profilometry

CYBEROPTICS CORP3 citations73
US6385335B1May 7, 2002

Apparatus and method for estimating background tilt and offset

CYBEROPTICS CORP8 citations73
US11604062B2Mar 14, 2023

Three-dimensional sensor with counterposed channels

CYBEROPTICS CORP2 citations72
US10883823B2Jan 5, 2021

Three-dimensional sensor with counterposed channels

CYBEROPTICS CORP1 citations72
USD446796SAug 21, 2001

Solder paste inspection machine

CYBEROPTICS CORP9 citations71

Showing the top 50 of 73 patents by PatentIndex Score.