Assignee
ELECTROGLAS INC
US37 patents
Top patents by PatentIndex Score
US5656942AAug 12, 1997
Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane
ELECTROGLAS INC152 citations98
US5450203ASep 12, 1995
Method and apparatus for determining an objects position, topography and for imaging
ELECTROGLAS INC251 citations96
US4066943AJan 3, 1978
High speed precision chuck assembly
ELECTROGLAS INC189 citations96
US3936743AFeb 3, 1976
High speed precision chuck assembly
ELECTROGLAS INC186 citations96
US6320372B1Nov 20, 2001
Apparatus and method for testing a substrate having a plurality of terminals
ELECTROGLAS INC114 citations94
US6096567AAug 1, 2000
Method and apparatus for direct probe sensing
ELECTROGLAS INC198 citations94
US4123706AOct 31, 1978
Probe construction
ELECTROGLAS INC71 citations94
US4001685AJan 4, 1977
Micro-circuit test probe
ELECTROGLAS INC168 citations94
US5515452AMay 7, 1996
Optical character recognition illumination method and system
ELECTROGLAS INC112 citations92
US7453260B2Nov 18, 2008
Testing circuits on substrate
ELECTROGLAS INC22 citations91
US6417683B1Jul 9, 2002
Apparatus for electrical testing of a substrate having a plurality of terminals
ELECTROGLAS INC16 citations89
US5982132ANov 9, 1999
Rotary wafer positioning system and method
ELECTROGLAS INC42 citations89
US4034293AJul 5, 1977
Micro-circuit test probe
ELECTROGLAS INC34 citations89
US3939414AFeb 17, 1976
Micro-circuit test apparatus
ELECTROGLAS INC39 citations89
US6547409B2Apr 15, 2003
Method and apparatus for illuminating projecting features on the surface of a semiconductor wafer
ELECTROGLAS INC22 citations85
US7352198B2Apr 1, 2008
Methods and apparatuses for improved stabilization in a probing system
ELECTROGLAS INC13 citations81
US6711304B2Mar 23, 2004
Method and apparatus for measuring angular rotation of an object
ELECTROGLAS INC15 citations79
US4056777ANov 1, 1977
Microcircuit test device with multi-axes probe control
ELECTROGLAS INC25 citations79
US7002337B2Feb 21, 2006
Testing circuits on substrates
ELECTROGLAS INC6 citations72
US6861859B1Mar 1, 2005
Testing circuits on substrates
ELECTROGLAS INC5 citations72
US6781394B1Aug 24, 2004
Testing circuits on substrate
ELECTROGLAS INC8 citations72
US6771060B1Aug 3, 2004
Testing circuits on substrates
ELECTROGLAS INC6 citations72
US6549649B1Apr 15, 2003
Apparatus and method for projecting an alignment image
ELECTROGLAS INC11 citations71
US7368929B2May 6, 2008
Methods and apparatuses for improved positioning in a probing system
ELECTROGLAS INC6 citations70
US6310985B1Oct 30, 2001
Measuring angular rotation of an object
ELECTROGLAS INC13 citations68
US7345466B2Mar 18, 2008
Method and apparatus for cleaning a probe card
ELECTROGLAS INC8 citations67
US6389702B1May 21, 2002
Method and apparatus for motion control
ELECTROGLAS INC11 citations66
US6668076B2Dec 23, 2003
Apparatus and method for projecting an alignment image
ELECTROGLAS INC3 citations60
US3940676AFeb 24, 1976
Damping control for positioning apparatus
ELECTROGLAS INC20 citations60
US6756801B2Jun 29, 2004
Apparatus for electrical testing of a substrate having a plurality of terminals
ELECTROGLAS INC2 citations59
US6114780ASep 5, 2000
Electromagnetic actuating mechanism
ELECTROGLAS INC2 citations59
US5344238ASep 6, 1994
Ball bearing assembly
ELECTROGLAS INC11 citations59
US7362116B1Apr 22, 2008
Method for probing impact sensitive and thin layered substrate
ELECTROGLAS INC4 citations51
US7259548B2Aug 21, 2007
Testing circuits on substrate
ELECTROGLAS INC0 citations51
US7180284B2Feb 20, 2007
Testing circuits on substrates
ELECTROGLAS INC0 citations51
US7098649B2Aug 29, 2006
Testing circuits on substrates
ELECTROGLAS INC0 citations51
US6127790AOct 3, 2000
Method and apparatus for passively trimming sawyer motors to correct for yaw errors
ELECTROGLAS INC1 citations41