Assignee
ELECTROGLAS INC
37 granted patents·1 pending application·1,786 citations·filing 1974–2006
Top patents by PatentIndex Score
38 records- 0198US4066943AHigh speed precision chuck assemblyELECTROGLAS INC·Filed 1975·Granted Jan 3, 1978·189 cites·15 claims
- 0298US4001685AMicro-circuit test probeELECTROGLAS INC·Filed 1974·Granted Jan 4, 1977·168 cites·10 claims
- 0398US3936743AHigh speed precision chuck assemblyELECTROGLAS INC·Filed 1974·Granted Feb 3, 1976·186 cites·10 claims
- 0496US5450203AMethod and apparatus for determining an objects position, topography and for imagingELECTROGLAS INC·Filed 1993·Granted Sep 12, 1995·251 cites·24 claims
- 0595US5656942AProber and tester with contact interface for integrated circuits-containing wafer held docked in a vertical planeELECTROGLAS INC·Filed 1995·Granted Aug 12, 1997·152 cites·17 claims
- 0694US4123706AProbe constructionELECTROGLAS INC·Filed 1977·Granted Oct 31, 1978·71 cites·26 claims
- 0793US7453260B2Testing circuits on substrateELECTROGLAS INC·Filed 2006·Granted Nov 18, 2008·22 cites·11 claims
- 0892US6320372B1Apparatus and method for testing a substrate having a plurality of terminalsELECTROGLAS INC·Filed 1999·Granted Nov 20, 2001·114 cites·24 claims
- 0992US6096567AMethod and apparatus for direct probe sensingELECTROGLAS INC·Filed 1997·Granted Aug 1, 2000·198 cites·16 claims
- 1089US3939414AMicro-circuit test apparatusELECTROGLAS INC·Filed 1974·Granted Feb 17, 1976·39 cites·16 claims
- 1188US7352198B2Methods and apparatuses for improved stabilization in a probing systemELECTROGLAS INC·Filed 2006·Granted Apr 1, 2008·13 cites·90 claims
- 1285US5515452AOptical character recognition illumination method and systemELECTROGLAS INC·Filed 1992·Granted May 7, 1996·112 cites·19 claims
- 1383US4034293AMicro-circuit test probeELECTROGLAS INC·Filed 1975·Granted Jul 5, 1977·34 cites·19 claims
- 1477US7368929B2Methods and apparatuses for improved positioning in a probing systemELECTROGLAS INC·Filed 2006·Granted May 6, 2008·6 cites·18 claims
- 1577US4056777AMicrocircuit test device with multi-axes probe controlELECTROGLAS INC·Filed 1976·Granted Nov 1, 1977·25 cites·22 claims
- 1676US7345466B2Method and apparatus for cleaning a probe cardELECTROGLAS INC·Filed 2005·Granted Mar 18, 2008·8 cites·14 claims
- 1773US6547409B2Method and apparatus for illuminating projecting features on the surface of a semiconductor waferELECTROGLAS INC·Filed 2001·Granted Apr 15, 2003·22 cites·35 claims
- 1870US6417683B1Apparatus for electrical testing of a substrate having a plurality of terminalsELECTROGLAS INC·Filed 2000·Granted Jul 9, 2002·16 cites·17 claims
- 1970US3940676ADamping control for positioning apparatusELECTROGLAS INC·Filed 1974·Granted Feb 24, 1976·20 cites·14 claims
- 2069US5982132ARotary wafer positioning system and methodELECTROGLAS INC·Filed 1997·Granted Nov 9, 1999·42 cites·48 claims
- 2162US6389702B1Method and apparatus for motion controlELECTROGLAS INC·Filed 2000·Granted May 21, 2002·11 cites·29 claims
- 2259US6711304B2Method and apparatus for measuring angular rotation of an objectELECTROGLAS INC·Filed 2001·Granted Mar 23, 2004·15 cites·41 claims
- 2358US7002337B2Testing circuits on substratesELECTROGLAS INC·Filed 2004·Granted Feb 21, 2006·6 cites·9 claims
- 2457US6781394B1Testing circuits on substrateELECTROGLAS INC·Filed 2001·Granted Aug 24, 2004·8 cites·22 claims
- 2557US6771060B1Testing circuits on substratesELECTROGLAS INC·Filed 2001·Granted Aug 3, 2004·6 cites·9 claims
- 2656US7362116B1Method for probing impact sensitive and thin layered substrateELECTROGLAS INC·Filed 2005·Granted Apr 22, 2008·4 cites·16 claims
- 2756US6861859B1Testing circuits on substratesELECTROGLAS INC·Filed 2001·Granted Mar 1, 2005·5 cites·12 claims
- 2848US6668076B2Apparatus and method for projecting an alignment imageELECTROGLAS INC·Filed 2003·Granted Dec 23, 2003·3 cites·32 claims
- 2942US7259548B2Testing circuits on substrateELECTROGLAS INC·Filed 2005·Granted Aug 21, 2007·0 cites·8 claims
- 3042US7180284B2Testing circuits on substratesELECTROGLAS INC·Filed 2005·Granted Feb 20, 2007·0 cites·28 claims
- 3141US6756801B2Apparatus for electrical testing of a substrate having a plurality of terminalsELECTROGLAS INC·Filed 2002·Granted Jun 29, 2004·2 cites·15 claims
- 3241US6549649B1Apparatus and method for projecting an alignment imageELECTROGLAS INC·Filed 1999·Granted Apr 15, 2003·11 cites·24 claims
- 3340US2002158643A1Method and apparatus for generating values for selected pixels used in evaluating semiconductor wafer bumpsELECTROGLAS INC·Filed 2002·Application pending·0 cites
- 3438US7098649B2Testing circuits on substratesELECTROGLAS INC·Filed 2004·Granted Aug 29, 2006·0 cites·14 claims
- 3534US6310985B1Measuring angular rotation of an objectELECTROGLAS INC·Filed 1998·Granted Oct 30, 2001·13 cites·16 claims
- 3628US6114780AElectromagnetic actuating mechanismELECTROGLAS INC·Filed 1998·Granted Sep 5, 2000·2 cites·24 claims
- 3726US5344238ABall bearing assemblyELECTROGLAS INC·Filed 1992·Granted Sep 6, 1994·11 cites·16 claims
- 3819US6127790AMethod and apparatus for passively trimming sawyer motors to correct for yaw errorsELECTROGLAS INC·Filed 1998·Granted Oct 3, 2000·1 cites·13 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →