Assignee
IZUHA KYOKO
JP·11 granted patents·2 pending applications·41 citations·filing 2008–2012
Top patents by PatentIndex Score
13 records- 0191US9177984B2Solid-state imaging device and electronic apparatus having a solid-state imaging deviceIZUHA KYOKO·Filed 2012·Granted Nov 3, 2015·8 cites·21 claims
- 0289US8558158B2Solid-state imaging device, manufacturing method and designing method thereof, and electronic deviceIZUHA KYOKO·Filed 2010·Granted Oct 15, 2013·6 cites·15 claims
- 0385US8847135B2Solid-state imaging device, driving method thereof and electronic apparatusIZUHA KYOKO·Filed 2011·Granted Sep 30, 2014·5 cites·7 claims
- 0485US8078996B2Method and system for correcting a mask pattern designIZUHA KYOKO·Filed 2009·Granted Dec 13, 2011·6 cites·7 claims
- 0583US8185856B2Manufacturing method, manufacturing program and manufacturing system for adjusting signal delay in a semiconductor deviceIZUHA KYOKO·Filed 2009·Granted May 22, 2012·11 cites·14 claims
- 0677US8605175B2Solid-state image capturing device including a photochromic film having a variable light transmittance, and electronic device including the solid-state image capturing deviceIZUHA KYOKO·Filed 2011·Granted Dec 10, 2013·1 cites·14 claims
- 0765US8490031B2Method, apparatus and program for adjusting feature dimensions to compensate for planarizing effects in the generation of mask data and manufacturing semiconductor deviceIZUHA KYOKO·Filed 2010·Granted Jul 16, 2013·2 cites·12 claims
- 0862US8112724B2Method of designing semiconductor integrated circuit, apparatus for designing semiconductor integrated circuit, recording medium, and mask manufacturing methodIZUHA KYOKO·Filed 2008·Granted Feb 7, 2012·2 cites·33 claims
- 0954US2012054695A1Pattern Verification Method, Pattern Verification System, Mask Manufacturing Method and Semiconductor Device Manufacturing MethodIZUHA KYOKO·Filed 2011·Application pending·0 cites
- 1052US8754968B2Solid-state imaging device and electronic equipmentIZUHA KYOKO·Filed 2011·Granted Jun 17, 2014·0 cites·20 claims
- 1149US8839158B2Pattern designing method, pattern designing program and pattern designing apparatusIZUHA KYOKO·Filed 2011·Granted Sep 16, 2014·0 cites·4 claims
- 1246US2009291512A1Semiconductor device pattern verification method, semiconductor device pattern verification program, and semiconductor device manufacturing methodIZUHA KYOKO·Filed 2009·Application pending·0 cites
- 1338US10163776B2Designing method of capacitive element in multilayer wirings for integrated circuit devices based on statistical processIZUHA KYOKO·Filed 2010·Granted Dec 25, 2018·0 cites·17 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →