Assignee
JOHNSTECH INT CORP
US99 patents
Top patents by PatentIndex Score
US5947749ASep 7, 1999
Electrical interconnect contact system
JOHNSTECH INT CORP160 citations99
US5645433AJul 8, 1997
Contacting system for electrical devices
JOHNSTECH INT CORP55 citations96
US6854981B2Feb 15, 2005
Small pin connecters
JOHNSTECH INT CORP31 citations93
US6203329B1Mar 20, 2001
Impedance controlled interconnection device
JOHNSTECH INT CORP36 citations93
US5967848AOct 19, 1999
Apparatus for providing controlled impedance in an electrical contact
JOHNSTECH INT CORP33 citations93
US5899755AMay 4, 1999
Integrated circuit test socket with enhanced noise imminity
JOHNSTECH INT CORP47 citations93
US5639247AJun 17, 1997
Contacting system for electrical devices
JOHNSTECH INT CORP42 citations93
US5634801AJun 3, 1997
Electrical interconnect contact system
JOHNSTECH INT CORP51 citations93
US5360348ANov 1, 1994
Integrated circuit device test socket
JOHNSTECH INT CORP54 citations93
US5336094AAug 9, 1994
Apparatus for interconnecting electrical contacts
JOHNSTECH INT CORP30 citations93
US9274141B1Mar 1, 2016
Low resistance low wear test pin for test contactor
JOHNSTECH INT CORP15 citations92
USD749526SFeb 16, 2016
Articulating contact pin
JOHNSTECH INT CORP18 citations92
US7737708B2Jun 15, 2010
Contact for use in testing integrated circuits
JOHNSTECH INT CORP21 citations92
US6876213B2Apr 5, 2005
Compliant actuator for IC test fixtures
JOHNSTECH INT CORP24 citations92
US7639026B2Dec 29, 2009
Electronic device test set and contact used therein
JOHNSTECH INT CORP24 citations91
US7445465B2Nov 4, 2008
Test socket
JOHNSTECH INT CORP24 citations91
US7338293B2Mar 4, 2008
Circuit contact to test apparatus
JOHNSTECH INT CORP24 citations91
US7059866B2Jun 13, 2006
integrated circuit contact to test apparatus
JOHNSTECH INT CORP17 citations91
US5749738AMay 12, 1998
Electrical interconnect contact system
JOHNSTECH INT CORP27 citations91
US7255576B2Aug 14, 2007
Kelvin contact module for a microcircuit test system
JOHNSTECH INT CORP21 citations90
USD1042344SSep 17, 2024
Contact
JOHNSTECH INT CORP7 citations84
US9429591B1Aug 30, 2016
On-center electrically conductive pins for integrated testing
JOHNSTECH INT CORP9 citations84
USD749525SFeb 16, 2016
Articulating contact pin
JOHNSTECH INT CORP11 citations84
USD1042346SSep 17, 2024
Contact pin for integrated circuit testing
JOHNSTECH INT CORP8 citations83
US10725069B1Jul 28, 2020
Integrated circuit contactor for testing ICs and method of construction
JOHNSTECH INT CORP13 citations83
US9606143B1Mar 28, 2017
Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testing
JOHNSTECH INT CORP12 citations83
US8354854B2Jan 15, 2013
Microcircuit testing interface having kelvin and signal contacts within a single slot
JOHNSTECH INT CORP8 citations83
US7074049B2Jul 11, 2006
Kelvin contact module for a microcircuit test system
JOHNSTECH INT CORP13 citations82
US10794933B1Oct 6, 2020
Integrated circuit contact test apparatus with and method of construction
JOHNSTECH INT CORP6 citations81
US10274515B1Apr 30, 2019
Waveguide integrated testing
JOHNSTECH INT CORP5 citations80
US9261537B2Feb 16, 2016
Wafer level integrated circuit contactor and method of construction
JOHNSTECH INT CORP13 citations80
US10114039B1Oct 30, 2018
Selectively geometric shaped contact pin for electronic component testing and method of fabrication
JOHNSTECH INT CORP10 citations79
US9500673B2Nov 22, 2016
Electrically conductive kelvin contacts for microcircuit tester
JOHNSTECH INT CORP7 citations77
US10495688B1Dec 3, 2019
Manual test socket and method of adjustment
JOHNSTECH INT CORP7 citations75
USD1090440SAug 26, 2025
Spring probe contact assembly
JOHNSTECH INT CORP1 citations74
US6529025B1Mar 4, 2003
Electrical continuity enhancement for sockets/contactors
JOHNSTECH INT CORP8 citations74
US5254834AOct 19, 1993
Method of forming closely-spaced, generally parallel slots through a thin wall and product formed thereby
JOHNSTECH INT CORP15 citations74
USD1042357SSep 17, 2024
Anti pinching contact
JOHNSTECH INT CORP5 citations73
USD1015282SFeb 20, 2024
Spring pin tip
JOHNSTECH INT CORP2 citations73
US10551412B2Feb 4, 2020
Low resistance low wear test pin for test contactor
JOHNSTECH INT CORP2 citations73
US9638714B2May 2, 2017
On-center electrically conductive pins for integrated testing
JOHNSTECH INT CORP2 citations73
US9341649B1May 17, 2016
On-center electrically conductive pins for integrated testing
JOHNSTECH INT CORP3 citations73
US11293968B2Apr 5, 2022
Integrated circuit testing for integrated circuits with antennas
JOHNSTECH INT CORP4 citations72
US10436819B1Oct 8, 2019
Constant pressure pin tip for testing integrated circuit chips
JOHNSTECH INT CORP3 citations72
US9958499B1May 1, 2018
Constant stress pin tip for testing integrated circuit chips
JOHNSTECH INT CORP3 citations72
US9678106B2Jun 13, 2017
Electrically conductive pins for microcircuit tester
JOHNSTECH INT CORP2 citations72
US5903164AMay 11, 1999
Active wafer level contacting system
JOHNSTECH INT CORP13 citations72
US11002760B1May 11, 2021
High isolation housing for testing integrated circuits
JOHNSTECH INT CORP4 citations71
US10247755B2Apr 2, 2019
Electrically conductive kelvin contacts for microcircuit tester
JOHNSTECH INT CORP5 citations71
US6861667B2Mar 1, 2005
Grounding inserts
JOHNSTECH INT CORP10 citations71
Showing the top 50 of 99 patents by PatentIndex Score.