Assignee
JOHNSTECH INT CORP
US·99 granted patents·7 pending applications·1,043 citations·filing 1992–2025
Top patents by PatentIndex Score
106 records- 0197US11293968B2Integrated circuit testing for integrated circuits with antennasJOHNSTECH INT CORP·Filed 2020·Granted Apr 5, 2022·4 cites·11 claims
- 0297US5947749AElectrical interconnect contact systemJOHNSTECH INT CORP·Filed 1996·Granted Sep 7, 1999·160 cites·55 claims
- 0396US9274141B1Low resistance low wear test pin for test contactorJOHNSTECH INT CORP·Filed 2013·Granted Mar 1, 2016·15 cites·15 claims
- 0495US10725069B1Integrated circuit contactor for testing ICs and method of constructionJOHNSTECH INT CORP·Filed 2018·Granted Jul 28, 2020·13 cites·16 claims
- 0593US10794933B1Integrated circuit contact test apparatus with and method of constructionJOHNSTECH INT CORP·Filed 2017·Granted Oct 6, 2020·6 cites·14 claims
- 0693US9606143B1Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testingJOHNSTECH INT CORP·Filed 2014·Granted Mar 28, 2017·12 cites·7 claims
- 0792US11906576B1Contact assembly array and testing system having contact assembly arrayJOHNSTECH INT CORP·Filed 2022·Granted Feb 20, 2024·2 cites·20 claims
- 0892US10247755B2Electrically conductive kelvin contacts for microcircuit testerJOHNSTECH INT CORP·Filed 2016·Granted Apr 2, 2019·5 cites·11 claims
- 0992US9429591B1On-center electrically conductive pins for integrated testingJOHNSTECH INT CORP·Filed 2014·Granted Aug 30, 2016·9 cites·11 claims
- 1092US9261537B2Wafer level integrated circuit contactor and method of constructionJOHNSTECH INT CORP·Filed 2013·Granted Feb 16, 2016·13 cites·10 claims
- 1192US7737708B2Contact for use in testing integrated circuitsJOHNSTECH INT CORP·Filed 2007·Granted Jun 15, 2010·21 cites·11 claims
- 1292US7445465B2Test socketJOHNSTECH INT CORP·Filed 2006·Granted Nov 4, 2008·24 cites·4 claims
- 1391US11879925B1Over the air (OTA) chip testing systemJOHNSTECH INT CORP·Filed 2021·Granted Jan 23, 2024·4 cites·20 claims
- 1491US10274515B1Waveguide integrated testingJOHNSTECH INT CORP·Filed 2016·Granted Apr 30, 2019·5 cites·15 claims
- 1591US7639026B2Electronic device test set and contact used thereinJOHNSTECH INT CORP·Filed 2007·Granted Dec 29, 2009·24 cites·3 claims
- 1690US9817026B2Wafer level integrated circuit contactor and method of constructionJOHNSTECH INT CORP·Filed 2016·Granted Nov 14, 2017·5 cites·11 claims
- 1790US7338293B2Circuit contact to test apparatusJOHNSTECH INT CORP·Filed 2006·Granted Mar 4, 2008·24 cites·4 claims
- 1889US11002760B1High isolation housing for testing integrated circuitsJOHNSTECH INT CORP·Filed 2018·Granted May 11, 2021·4 cites·11 claims
- 1989US9500673B2Electrically conductive kelvin contacts for microcircuit testerJOHNSTECH INT CORP·Filed 2013·Granted Nov 22, 2016·7 cites·17 claims
- 2088US11802909B2Compliant ground block and testing system having compliant ground blockJOHNSTECH INT CORP·Filed 2022·Granted Oct 31, 2023·1 cites·20 claims
- 2188US10761112B1Self flattening test socket with anti-bowing and elastomer retentionJOHNSTECH INT CORP·Filed 2018·Granted Sep 1, 2020·3 cites·19 claims
- 2288US10436819B1Constant pressure pin tip for testing integrated circuit chipsJOHNSTECH INT CORP·Filed 2018·Granted Oct 8, 2019·3 cites·11 claims
- 2388US10114039B1Selectively geometric shaped contact pin for electronic component testing and method of fabricationJOHNSTECH INT CORP·Filed 2016·Granted Oct 30, 2018·10 cites·10 claims
- 2487US9678106B2Electrically conductive pins for microcircuit testerJOHNSTECH INT CORP·Filed 2016·Granted Jun 13, 2017·2 cites·20 claims
- 2586US10551412B2Low resistance low wear test pin for test contactorJOHNSTECH INT CORP·Filed 2017·Granted Feb 4, 2020·2 cites·8 claims
- 2686US10078101B2Wafer level integrated circuit probe array and method of constructionJOHNSTECH INT CORP·Filed 2015·Granted Sep 18, 2018·4 cites·8 claims
- 2786US9958499B1Constant stress pin tip for testing integrated circuit chipsJOHNSTECH INT CORP·Filed 2016·Granted May 1, 2018·3 cites·5 claims
- 2885US11867752B1Contact assembly and kelvin testing system having contact assemblyJOHNSTECH INT CORP·Filed 2022·Granted Jan 9, 2024·1 cites·16 claims
- 2985US5645433AContacting system for electrical devicesJOHNSTECH INT CORP·Filed 1994·Granted Jul 8, 1997·55 cites·43 claims
- 3084US10495688B1Manual test socket and method of adjustmentJOHNSTECH INT CORP·Filed 2017·Granted Dec 3, 2019·7 cites·14 claims
- 3184US5899755AIntegrated circuit test socket with enhanced noise imminityJOHNSTECH INT CORP·Filed 1997·Granted May 4, 1999·47 cites·25 claims
- 3284US5360348AIntegrated circuit device test socketJOHNSTECH INT CORP·Filed 1993·Granted Nov 1, 1994·54 cites·6 claims
- 3382US9476936B1Thermal management for microcircuit testing systemJOHNSTECH INT CORP·Filed 2014·Granted Oct 25, 2016·6 cites·7 claims
- 3482USD749526SArticulating contact pinJOHNSTECH INT CORP·Filed 2015·Granted Feb 16, 2016·18 cites·1 claims
- 3582US7255576B2Kelvin contact module for a microcircuit test systemJOHNSTECH INT CORP·Filed 2006·Granted Aug 14, 2007·21 cites·5 claims
- 3682US6854981B2Small pin connectersJOHNSTECH INT CORP·Filed 2003·Granted Feb 15, 2005·31 cites·6 claims
- 3782US5634801AElectrical interconnect contact systemJOHNSTECH INT CORP·Filed 1994·Granted Jun 3, 1997·51 cites·12 claims
- 3881US10073117B2Resilient interposer with electrically conductive slide-by pins as part of a microcircuit testerJOHNSTECH INT CORP·Filed 2017·Granted Sep 11, 2018·1 cites·20 claims
- 3981US6876213B2Compliant actuator for IC test fixturesJOHNSTECH INT CORP·Filed 2003·Granted Apr 5, 2005·24 cites·12 claims
- 4080US11360117B1Waveguide integrated circuit testingJOHNSTECH INT CORP·Filed 2020·Granted Jun 14, 2022·1 cites·16 claims
- 4180US5967848AApparatus for providing controlled impedance in an electrical contactJOHNSTECH INT CORP·Filed 1997·Granted Oct 19, 1999·33 cites·6 claims
- 4279USD1042346SContact pin for integrated circuit testingJOHNSTECH INT CORP·Filed 2022·Granted Sep 17, 2024·8 cites·1 claims
- 4379US11821943B2Compliant ground block and testing system having compliant ground blockJOHNSTECH INT CORP·Filed 2021·Granted Nov 21, 2023·1 cites·20 claims
- 4478USD1042344SContactJOHNSTECH INT CORP·Filed 2021·Granted Sep 17, 2024·7 cites·1 claims
- 4578US11307232B1Waveguide integrated circuit testingJOHNSTECH INT CORP·Filed 2020·Granted Apr 19, 2022·1 cites·19 claims
- 4677US10698000B1Waveguide integrated testingJOHNSTECH INT CORP·Filed 2019·Granted Jun 30, 2020·1 cites·16 claims
- 4777US8354854B2Microcircuit testing interface having kelvin and signal contacts within a single slotJOHNSTECH INT CORP·Filed 2008·Granted Jan 15, 2013·8 cites·9 claims
- 4877US5639247AContacting system for electrical devicesJOHNSTECH INT CORP·Filed 1995·Granted Jun 17, 1997·42 cites·60 claims
- 4976US9341649B1On-center electrically conductive pins for integrated testingJOHNSTECH INT CORP·Filed 2014·Granted May 17, 2016·3 cites·6 claims
- 5073US7059866B2integrated circuit contact to test apparatusJOHNSTECH INT CORP·Filed 2004·Granted Jun 13, 2006·17 cites·4 claims
Showing the top 50 of 106 patent records by PatentIndex Score.
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