Assignee
KASUKABE SUSUMU
JP·1 granted patent·2 pending applications·5 citations·filing 2007–2011
Top patents by PatentIndex Score
3 records- 0178US8314624B2Probe card, semiconductor inspecting apparatus, and manufacturing method of semiconductor deviceKASUKABE SUSUMU·Filed 2011·Granted Nov 20, 2012·5 cites·16 claims
- 0252US2009209053A1Connection device and test systemKASUKABE SUSUMU·Filed 2009·Application pending·0 cites
- 0340US2008029763A1Transmission Circuit, Connecting Sheet, Probe Sheet, Probe Card, Semiconductor Inspection System and Method of Manufacturing Semiconductor DeviceKASUKABE SUSUMU·Filed 2007·Application pending·0 cites
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