Assignee
KITAMURA SHIGERU
JP·3 granted patents·2 pending applications·4 citations·filing 2003–2012
Top patents by PatentIndex Score
5 records- 0163US9101937B2Precise temperature controlling unit and method thereofKITAMURA SHIGERU·Filed 2010·Granted Aug 11, 2015·2 cites·13 claims
- 0257US8409522B2Analyzing instrument, temperature control method for liquid in analyzing instrument, and analyzing apparatusKITAMURA SHIGERU·Filed 2009·Granted Apr 2, 2013·0 cites·4 claims
- 0357US8398937B2Microchannel and analyzing deviceKITAMURA SHIGERU·Filed 2009·Granted Mar 19, 2013·2 cites·7 claims
- 0449US2006073600A1Temperature control method for liquid components in analyzing instrument, the analyzing instrument and analyzing apparatusKITAMURA SHIGERU·Filed 2003·Application pending·0 cites
- 0540US2012211659A1Terahertz Wave Characteristic Measurement Method, Material Detection Method, Measurement Instrument, Terahertz Wave Characteristic Measurement Device and Material Detection DeviceKITAMURA SHIGERU·Filed 2012·Application pending·0 cites
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