Assignee
MARUYAMA SHIGEYUKI
JP·2 granted patents·1 citations·filing 2006–2011
Top patents by PatentIndex Score
2 records- 0153US8404496B2Method of testing a semiconductor device and suctioning a semiconductor device in the wafer stateMARUYAMA SHIGEYUKI·Filed 2006·Granted Mar 26, 2013·1 cites·2 claims
- 0233US8766659B2Contactor including a covalent bond layerMARUYAMA SHIGEYUKI·Filed 2011·Granted Jul 1, 2014·0 cites·7 claims
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