Assignee
MATSUSHITA HIROSHI
JP·2 granted patents·2 pending applications·18 citations·filing 2008–2011
Top patents by PatentIndex Score
4 records- 0177US8081814B2Linear pattern detection method and apparatusMATSUSHITA HIROSHI·Filed 2009·Granted Dec 20, 2011·15 cites·17 claims
- 0260US8170707B2Failure detecting method, failure detecting apparatus, and semiconductor device manufacturing methodMATSUSHITA HIROSHI·Filed 2008·Granted May 1, 2012·3 cites·9 claims
- 0347US2010060470A1Failure cause identifying device and method for identifying failure causeMATSUSHITA HIROSHI·Filed 2009·Application pending·0 cites
- 0436US2012029679A1Defect analysis method of semiconductor deviceMATSUSHITA HIROSHI·Filed 2011·Application pending·0 cites
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