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MPI CORP
TW124 patents
Top patents by PatentIndex Score
US7595651B2Sep 29, 2009
Cantilever-type probe card for high frequency application
MPI CORP24 citations88
USD922396SJun 15, 2021
Display screen or portion thereof with graphical user interface
MPI CORP16 citations83
US11144198B2Oct 12, 2021
Control method of touch display apparatus
MPI CORP7 citations82
US7791359B2Sep 7, 2010
Probe for high frequency signal transmission and probe card using the same
MPI CORP11 citations82
US7683645B2Mar 23, 2010
High-frequency probe card and transmission line for high-frequency probe card
MPI CORP11 citations82
US10119991B2Nov 6, 2018
Vertical probe device and supporter used in the same
MPI CORP8 citations80
US10295567B2May 21, 2019
Probe module supporting loopback test
MPI CORP2 citations72
US10070512B2Sep 4, 2018
Multilayer circuit board
MPI CORP4 citations72
US9658249B2May 23, 2017
Probe card capable of transmitting high-frequency signals
MPI CORP2 citations72
US9596769B2Mar 14, 2017
Multilayer circuit board
MPI CORP5 citations72
US9316685B2Apr 19, 2016
Probe card of low power loss
MPI CORP4 citations72
US9618536B2Apr 11, 2017
Probe needle and probe module using the same
MPI CORP5 citations71
US11353501B2Jun 7, 2022
Wafer inspection method and wafer probing system
MPI CORP2 citations70
US10436818B2Oct 8, 2019
Probe module having cantilever MEMS probe and method of making the same
MPI CORP2 citations70
US11733267B2Aug 22, 2023
Probe head and probe card
MPI CORP2 citations69
US10161995B2Dec 25, 2018
Temperature control system and method thereof
MPI CORP2 citations69
US9377214B2Jun 28, 2016
Heating device using photodetector to detect temperature and method for protecting the same
MPI CORP5 citations69
US9759746B2Sep 12, 2017
Probe module
MPI CORP2 citations67
US9643271B2May 9, 2017
Method for making support structure for probing device
MPI CORP2 citations67
US9470715B2Oct 18, 2016
Probe head
MPI CORP4 citations67
US12025637B2Jul 2, 2024
Probe card
MPI CORP2 citations66
US10281488B2May 7, 2019
Probe card having replaceable probe module and assembling method and probe module replacing method of the same
MPI CORP2 citations66
US9823272B2Nov 21, 2017
Wafer testing probe card
MPI CORP3 citations66
US10655893B2May 19, 2020
Cooling system capable of defrosting
MPI CORP4 citations65
US10041974B2Aug 7, 2018
Probe head of vertical probe card
MPI CORP5 citations63
US7579857B2Aug 25, 2009
Electrical contact device of probe card
MPI CORP5 citations63
US9958477B2May 1, 2018
Testing machine and operation method thereof
MPI CORP2 citations62
US11262401B2Mar 1, 2022
Wafer probe station
MPI CORP0 citations61
US11036390B2Jun 15, 2021
Display method of display apparatus
MPI CORP1 citations61
US9658250B2May 23, 2017
Vertical probe device having positioning film
MPI CORP2 citations61
US9506949B2Nov 29, 2016
Spring probe
MPI CORP2 citations61
US9442134B2Sep 13, 2016
Signal path switch and probe card having the signal path switch
MPI CORP2 citations60
US12196779B2Jan 14, 2025
Probe system and machine apparatus thereof
MPI CORP0 citations59
USD1031738SJun 18, 2024
Die plate assembly for probe head
MPI CORP0 citations59
US11703541B2Jul 18, 2023
Semiconductor inspecting method for ensuring scrubbing length on pad
MPI CORP0 citations59
US11693050B2Jul 4, 2023
Semiconductor inspecting method
MPI CORP0 citations59
US11619656B2Apr 4, 2023
Probe head and die set having horizontally fine adjustable die and probe head adjusting method
MPI CORP1 citations59
US9435856B2Sep 6, 2016
Position adjustable probing device and probe card assembly using the same
MPI CORP2 citations59
US9157929B2Oct 13, 2015
Apparatus for probing die electricity and method for forming the same
MPI CORP3 citations59
US12480976B2Nov 25, 2025
Probe card and manufacturing method thereof
MPI CORP0 citations58
US11874313B2Jan 16, 2024
Probe card and manufacturing method thereof
MPI CORP0 citations58
US11150269B2Oct 19, 2021
Probe head for high frequency signal test and medium or low frequency signal test at the same time
MPI CORP1 citations58
US7724009B2May 25, 2010
Method of making high-frequency probe, probe card using the high-frequency probe
MPI CORP3 citations58
US9201098B2Dec 1, 2015
High frequency probe card
MPI CORP3 citations57
US12092658B2Sep 17, 2024
Optical detection system and alignment method for a predetermined target object
MPI CORP0 citations55
US11402407B2Aug 2, 2022
Positionable probe card and manufacturing method thereof
MPI CORP0 citations54
USD983681SApr 18, 2023
Probe for testing device under test
MPI CORP0 citations53
US9927487B2Mar 27, 2018
Probe card having configurable structure for exchanging or swapping electronic components for impedance matching
MPI CORP0 citations51
US9746495B2Aug 29, 2017
Probe device having spring probe
MPI CORP0 citations51
US9545002B2Jan 10, 2017
Multilayer circuit board
MPI CORP0 citations51
Showing the top 50 of 124 patents by PatentIndex Score.