Assignee
NIHON MICRONICS KK
JP191 patents
Top patents by PatentIndex Score
US6019612AFeb 1, 2000
Electrical connecting apparatus for electrically connecting a device to be tested
NIHON MICRONICS KK127 citations97
US5888075AMar 30, 1999
Auxiliary apparatus for testing device
NIHON MICRONICS KK87 citations95
US7946855B2May 24, 2011
Contact and electrical connecting apparatus
NIHON MICRONICS KK33 citations92
US7629807B2Dec 8, 2009
Electrical test probe
NIHON MICRONICS KK31 citations91
US7458818B2Dec 2, 2008
Electric connector and electrical connecting apparatus using the same
NIHON MICRONICS KK27 citations90
US6271674B1Aug 7, 2001
Probe card
NIHON MICRONICS KK37 citations90
US7888958B2Feb 15, 2011
Current test probe having a solder guide portion, and related probe assembly and production method
NIHON MICRONICS KK20 citations89
USD770985SNov 8, 2016
Electric contact
NIHON MICRONICS KK6 citations84
USD765602SSep 6, 2016
Electric contact
NIHON MICRONICS KK8 citations84
US7619425B2Nov 17, 2009
Electrical connecting apparatus
NIHON MICRONICS KK8 citations84
US7474111B2Jan 6, 2009
Electrical probe assembly with guard members for the probes
NIHON MICRONICS KK10 citations84
US7934945B2May 3, 2011
Electrical connecting apparatus
NIHON MICRONICS KK10 citations83
US7924038B2Apr 12, 2011
Probe and electrical connecting apparatus using it
NIHON MICRONICS KK7 citations83
US7819672B2Oct 26, 2010
Electrical connecting apparatus with inclined probe recess surfaces
NIHON MICRONICS KK11 citations83
US7791364B2Sep 7, 2010
Electronic device probe card with improved probe grouping
NIHON MICRONICS KK8 citations83
US7586321B2Sep 8, 2009
Electrical test probe and electrical test probe assembly
NIHON MICRONICS KK19 citations83
US7377788B2May 27, 2008
Electrical connecting apparatus and contact
NIHON MICRONICS KK16 citations83
US10859599B2Dec 8, 2020
Electrical connection apparatus
NIHON MICRONICS KK8 citations82
US7898339B2Mar 1, 2011
Amplifier circuit
NIHON MICRONICS KK10 citations82
US7843198B2Nov 30, 2010
Electrical connecting apparatus
NIHON MICRONICS KK8 citations82
US7586316B2Sep 8, 2009
Probe board mounting apparatus
NIHON MICRONICS KK12 citations82
US7468610B2Dec 23, 2008
Electrical connecting apparatus
NIHON MICRONICS KK9 citations82
US7934944B2May 3, 2011
Electrical connecting apparatus
NIHON MICRONICS KK8 citations81
US7800001B2Sep 21, 2010
Probe sheet and electrical connecting apparatus
NIHON MICRONICS KK14 citations81
US7625219B2Dec 1, 2009
Electrical connecting apparatus
NIHON MICRONICS KK8 citations81
US7449906B2Nov 11, 2008
Probe for testing an electrical device
NIHON MICRONICS KK11 citations81
US7303404B2Dec 4, 2007
Contact and electrical connecting apparatus
NIHON MICRONICS KK13 citations81
US7165975B2Jan 23, 2007
Electrical connecting apparatus
NIHON MICRONICS KK12 citations80
US7471095B2Dec 30, 2008
Electrical connecting apparatus and method for use thereof
NIHON MICRONICS KK9 citations79
USD702646SApr 15, 2014
Electric contact
NIHON MICRONICS KK6 citations78
US7121842B2Oct 17, 2006
Electrical connector
NIHON MICRONICS KK9 citations74
US11762008B2Sep 19, 2023
Connecting device for inspection
NIHON MICRONICS KK2 citations73
US11150268B2Oct 19, 2021
Electric connection device
NIHON MICRONICS KK2 citations73
US10969442B2Apr 6, 2021
Test system
NIHON MICRONICS KK2 citations73
US10101365B2Oct 16, 2018
Semiconductor module, electrical connector, and inspection apparatus
NIHON MICRONICS KK2 citations73
USD770986SNov 8, 2016
Plunger housing body
NIHON MICRONICS KK4 citations73
USD766188SSep 13, 2016
Plunger housing body
NIHON MICRONICS KK4 citations73
USD766187SSep 13, 2016
Plunger housing body
NIHON MICRONICS KK4 citations73
US9400309B2Jul 26, 2016
Electric connecting apparatus
NIHON MICRONICS KK4 citations73
US7815473B2Oct 19, 2010
Contact and connecting apparatus
NIHON MICRONICS KK7 citations73
US6657448B2Dec 2, 2003
Electrical connection apparatus
NIHON MICRONICS KK8 citations73
US6595794B2Jul 22, 2003
Electrical contact method and apparatus in semiconductor device inspection equipment
NIHON MICRONICS KK8 citations73
US5982184ANov 9, 1999
Test head for integrated circuits
NIHON MICRONICS KK12 citations73
US11022627B2Jun 1, 2021
Probe and electric connecting apparatus
NIHON MICRONICS KK2 citations72
USD918150SMay 4, 2021
Electric contact
NIHON MICRONICS KK2 citations72
US10768207B2Sep 8, 2020
Electrical connection device
NIHON MICRONICS KK2 citations72
US10215801B2Feb 26, 2019
Contact inspection device having a probe head and rotation restricting portions
NIHON MICRONICS KK4 citations72
US7667472B2Feb 23, 2010
Probe assembly, method of producing it and electrical connecting apparatus
NIHON MICRONICS KK7 citations72
US11624679B2Apr 11, 2023
Optical probe, optical probe array, test system and test method
NIHON MICRONICS KK2 citations71
US9535108B2Jan 3, 2017
Inspection apparatus and inspection method
NIHON MICRONICS KK2 citations71
Showing the top 50 of 191 patents by PatentIndex Score.