Assignee
OTSUKI HAYASHI
JP·1 granted patent·2 pending applications·4 citations·filing 2006–2010
Top patents by PatentIndex Score
3 records- 0176US8100147B2Particle-measuring system and particle-measuring methodOTSUKI HAYASHI·Filed 2007·Granted Jan 24, 2012·4 cites·13 claims
- 0248US2010139565A1Particle-measuring system and particle-measuring methodOTSUKI HAYASHI·Filed 2010·Application pending·0 cites
- 0347US2006231028A1Method for depositing metallic nitride series thin filmOTSUKI HAYASHI·Filed 2006·Application pending·0 cites
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