Assignee
SEMICONDUCTOR MFG INT BEIJING
CN·27 granted patents·6 pending applications·52 citations·filing 2011–2015
Top patents by PatentIndex Score
33 records- 0183US9111874B2Semiconductor structures and fabrication method thereofSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Aug 18, 2015·7 cites·20 claims
- 0276US9112025B2LDMOS device and fabrication methodSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Aug 18, 2015·5 cites·20 claims
- 0375US9123606B2Pixel structures of CMOS imaging sensorsSEMICONDUCTOR MFG INT BEIJING·Filed 2015·Granted Sep 1, 2015·3 cites·7 claims
- 0474US9299788B2Multi-gate VDMOS transistorSEMICONDUCTOR MFG INT BEIJING·Filed 2015·Granted Mar 29, 2016·2 cites·17 claims
- 0574US8581311B1Semiconductor deviceSEMICONDUCTOR MFG INT BEIJING·Filed 2013·Granted Nov 12, 2013·3 cites·8 claims
- 0673US9059210B2Enhanced stress memorization technique for metal gate transistorsSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Jun 16, 2015·3 cites·20 claims
- 0773US8372722B2Method for fabricating a semiconductor deviceSEMICONDUCTOR MFG INT BEIJING·Filed 2011·Granted Feb 12, 2013·4 cites·21 claims
- 0872US9207138B2Capacitive pressure sensors and fabrication methods thereofSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Dec 8, 2015·2 cites·10 claims
- 0970US9018712B2Transistors and fabrication methods thereof using a stacked protection layerSEMICONDUCTOR MFG INT BEIJING·Filed 2013·Granted Apr 28, 2015·3 cites·16 claims
- 1070US9012317B2Flash memory and fabrication method thereofSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Apr 21, 2015·3 cites·15 claims
- 1167US9117053B2Enhanced optical proximity correction (OPC) method and systemSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Aug 25, 2015·1 cites·15 claims
- 1265US9093317B2Semiconductor device and fabrication methodSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Jul 28, 2015·2 cites·15 claims
- 1364US8829483B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR MFG INT BEIJING·Filed 2013·Granted Sep 9, 2014·2 cites·8 claims
- 1463US9059068B2Pixel structures of CMOS imaging sensors and fabrication method thereofSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Jun 16, 2015·2 cites·10 claims
- 1562US8956883B1Magnetic tunnel junctions and fabrication method thereofSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Feb 17, 2015·2 cites·15 claims
- 1661US9184291B2FinFET device and method of forming fin in the sameSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Nov 10, 2015·1 cites·14 claims
- 1760US9142675B2Fin field effect transistors and fabrication method thereofSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Sep 22, 2015·2 cites·15 claims
- 1860US8971099B1Method of measuring threshold voltage of MOS transistor in SRAM arraySEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Mar 3, 2015·3 cites·19 claims
- 1957US8975091B2Method of fabricating a magnetic tunnel junction deviceSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Mar 10, 2015·0 cites·17 claims
- 2056US9337324B2Bipolar transistor, band-gap reference circuit and virtual ground reference circuitSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted May 10, 2016·0 cites·5 claims
- 2153US9190327B2CMOS transistors and fabrication method thereofSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Nov 17, 2015·2 cites·19 claims
- 2247US9112023B2Multi-gate VDMOS transistor and method for forming the sameSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Aug 18, 2015·0 cites·17 claims
- 2346US9318445B2Semiconductor device and manufacturing method thereof for protecting metal-gate from oxidationSEMICONDUCTOR MFG INT BEIJING·Filed 2013·Granted Apr 19, 2016·0 cites·5 claims
- 2446US2016013270A1Semiconductor device and manufacturing method thereofSEMICONDUCTOR MFG INT BEIJING·Filed 2015·Application pending·0 cites
- 2545US9202885B2Nanoscale silicon Schottky diode array for low power phase change memory applicationSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Dec 1, 2015·0 cites·10 claims
- 2643US9324712B2Integrated circuit and related manufacturing methodSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Apr 26, 2016·0 cites·20 claims
- 2742US9256703B1Method of detecting a scattering bar by simulationSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Granted Feb 9, 2016·0 cites·13 claims
- 2841US2015169820A1Weak points auto-correction process for opc tape-outSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Application pending·0 cites
- 2937US2015041948A1Semiconductor device including sti structure and method for forming the sameSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Application pending·0 cites
- 3036US2013015443A1Semiconductor device and manufacturing method thereofSEMICONDUCTOR MFG INT BEIJING·Filed 2011·Application pending·0 cites
- 3136US2015179571A1Metal interconnect structures and fabrication method thereofSEMICONDUCTOR MFG INT BEIJING·Filed 2014·Application pending·0 cites
- 3232US9368412B2Method for manufacturing semiconductor deviceSEMICONDUCTOR MFG INT BEIJING·Filed 2015·Granted Jun 14, 2016·0 cites·20 claims
- 3332US2015311125A1Semiconductor device and method of manufacturing the sameSEMICONDUCTOR MFG INT BEIJING·Filed 2015·Application pending·0 cites
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