Assignee
SEO HUN-KYO
KR·2 granted patents·2 citations·filing 2012–2012
Top patents by PatentIndex Score
2 records- 0161US8922233B2Apparatus for testing a semiconductor device and method of testing a semiconductor deviceSEO HUN-KYO·Filed 2012·Granted Dec 30, 2014·2 cites·18 claims
- 0235US8981804B2Contact apparatus and semiconductor test equipment using the sameSEO HUN-KYO·Filed 2012·Granted Mar 17, 2015·0 cites·20 claims
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