Assignee
SHIOZAWA MASAKUNI
JP·2 granted patents·1 pending application·8 citations·filing 2007–2011
Top patents by PatentIndex Score
3 records- 0180US8816709B2Electronic component testing device and electronic component transport methodSHIOZAWA MASAKUNI·Filed 2011·Granted Aug 26, 2014·6 cites·12 claims
- 0269US8558570B2Component test apparatus and component transport methodSHIOZAWA MASAKUNI·Filed 2011·Granted Oct 15, 2013·2 cites·13 claims
- 0349US2007252285A1Semiconductor device, electronic device, electronic apparatus, and method of manufacturing semiconductor deviceSHIOZAWA MASAKUNI·Filed 2007·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →