Individual holder
WALKER DARRYL G
US·48 granted patents·7 pending applications·219 citations·filing 2004–2025
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
55 records- 0198US9286991B1Multi-chip non-volatile semiconductor memory package including heater and sensor elementsWALKER DARRYL G·Filed 2015·Granted Mar 15, 2016·29 cites·20 claims
- 0298US8497453B2Semiconductor device having variable parameter selection based on temperatureWALKER DARRYL G·Filed 2011·Granted Jul 30, 2013·18 cites·20 claims
- 0397US9711500B1Package including a plurality of stacked semiconductor devices having area efficient ESD protectionWALKER DARRYL G·Filed 2016·Granted Jul 18, 2017·18 cites·20 claims
- 0497US8308359B2Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL G·Filed 2010·Granted Nov 13, 2012·18 cites·22 claims
- 0597US8081532B2Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL G·Filed 2010·Granted Dec 20, 2011·18 cites·20 claims
- 0697US7639548B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL G·Filed 2009·Granted Dec 29, 2009·28 cites·20 claims
- 0796US9940999B2Semiconductor devices, circuits and methods for read and/or write assist of an SRAM circuit portion based on voltage detection and/or temperature detection circuitsWALKER DARRYL G·Filed 2017·Granted Apr 10, 2018·15 cites·20 claims
- 0896US9194754B2Power up of semiconductor device having a temperature circuit and method thereforWALKER DARRYL G·Filed 2014·Granted Nov 24, 2015·10 cites·18 claims
- 0993US9613719B1Multi-chip non-volatile semiconductor memory package including heater and sensor elementsWALKER DARRYL G·Filed 2015·Granted Apr 4, 2017·6 cites·18 claims
- 1092US9378778B1Package including a plurality of stacked semiconductor devices including a capacitance enhanced through via and method of manufactureWALKER DARRYL G·Filed 2015·Granted Jun 28, 2016·5 cites·20 claims
- 1191US10128215B1Package including a plurality of stacked semiconductor devices having area efficient ESD protectionWALKER DARRYL G·Filed 2016·Granted Nov 13, 2018·5 cites·19 claims
- 1290US9929127B1Package including a plurality of stacked semiconductor devices an interposer and interface connectionsWALKER DARRYL G·Filed 2017·Granted Mar 27, 2018·3 cites·20 claims
- 1390US9645191B2Testing and setting performance parameters in a semiconductor device and method thereforWALKER DARRYL G·Filed 2014·Granted May 9, 2017·9 cites·19 claims
- 1488US9274007B2Semiconductor device having temperature sensor circuitsWALKER DARRYL G·Filed 2014·Granted Mar 1, 2016·5 cites·19 claims
- 1586US10163524B2Testing a semiconductor device including a voltage detection circuit and temperature detection circuit that can be used to generate read assist and/or write assist in an SRAM circuit portion and method thereforWALKER DARRYL G·Filed 2017·Granted Dec 25, 2018·5 cites·20 claims
- 1686US9997513B1Package including a plurality of stacked semiconductor devices having area efficient ESD protectionWALKER DARRYL G·Filed 2017·Granted Jun 12, 2018·3 cites·20 claims
- 1785US10134720B1Package including a plurality of stacked semiconductor devices having area efficient ESD protectionWALKER DARRYL G·Filed 2016·Granted Nov 20, 2018·3 cites·20 claims
- 1884US9455189B1Package including a plurality of stacked semiconductor devices including a capacitance enhanced through via and method of manufactureWALKER DARRYL G·Filed 2015·Granted Sep 27, 2016·2 cites·20 claims
- 1983US10418346B1Package including a plurality of stacked semiconductor devices having area efficient ESD protectionWALKER DARRYL G·Filed 2018·Granted Sep 17, 2019·2 cites·20 claims
- 2083US10365318B2Testing and setting performance parameters in a semiconductor device and method thereforWALKER DARRYL G·Filed 2018·Granted Jul 30, 2019·1 cites·17 claims
- 2183US9766135B2Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL G·Filed 2012·Granted Sep 19, 2017·2 cites·17 claims
- 2281US9810585B2Semiconductor device having a temperature circuit that provides a plurality of temperature operating rangesWALKER DARRYL G·Filed 2014·Granted Nov 7, 2017·2 cites·20 claims
- 2379US2025294895A1Integrated circuits devices, systems and methodsWALKER DARRYL G·Filed 2025·Application pending·0 cites
- 2479US2025294857A1Integrated circuits devices, systems and methodsWALKER DARRYL G·Filed 2025·Application pending·0 cites
- 2579US2025311447A1Integrated circuits devices, systems and methodsWALKER DARRYL G·Filed 2025·Application pending·0 cites
- 2679US2025294858A1Integrated circuits devices, systems and methodsWALKER DARRYL G·Filed 2025·Application pending·0 cites
- 2779US2025293150A1Integrated circuits devices, systems and methodsWALKER DARRYL G·Filed 2025·Application pending·0 cites
- 2879US2025294896A1Integrated circuits devices, systems and methodsWALKER DARRYL G·Filed 2025·Application pending·0 cites
- 2979US2025294859A1Integrated circuits devices, systems and methodsWALKER DARRYL G·Filed 2025·Application pending·0 cites
- 3076US9772232B2Semiconductor device having temperature sensor circuit that detects a temperature range upper limit value and a temperature range lower limit valueWALKER DARRYL G·Filed 2014·Granted Sep 26, 2017·2 cites·19 claims
- 3172US10403384B2Testing a semiconductor device including a voltage detection circuit and temperature detection circuit that can be used to generate read assist and/or write assist in an SRAM circuit portion and method thereforWALKER DARRYL G·Filed 2017·Granted Sep 3, 2019·2 cites·10 claims
- 3270US10665294B2Semiconductor devices, circuits and methods for read and/or write assist of an SRAM circuit portion based on voltage detection and/or temperature detection circuitsWALKER DARRYL G·Filed 2018·Granted May 26, 2020·1 cites·20 claims
- 3369US9631982B2Semiconductor device having temperature sensor circuitsWALKER DARRYL G·Filed 2016·Granted Apr 25, 2017·1 cites·20 claims
- 3468US10262976B1Package including a plurality of stacked semiconductor devices, an interposer and interface connectionsWALKER DARRYL G·Filed 2019·Granted Apr 16, 2019·0 cites·20 claims
- 3567US10262975B1Package including a plurality of stacked semiconductor devices, an interposer and interface connectionsWALKER DARRYL G·Filed 2018·Granted Apr 16, 2019·0 cites·22 claims
- 3667US10177121B1Package including a plurality of stacked semiconductor devices, an interposer and interface connectionsWALKER DARRYL G·Filed 2018·Granted Jan 8, 2019·0 cites·20 claims
- 3767US10014049B2Semiconductor devices, circuits and methods for read and/or write assist of an SRAM circuit portion based on voltage detection and/or temperature detection circuitsWALKER DARRYL G·Filed 2017·Granted Jul 3, 2018·1 cites·20 claims
- 3865US10115710B1Package including a plurality of stacked semiconductor devices, an interposer and interface connectionsWALKER DARRYL G·Filed 2018·Granted Oct 30, 2018·0 cites·20 claims
- 3964US10260962B2Semiconductor device having temperature sensor circuit that detects a temperature range upper limit value and a temperature range lower limit valueWALKER DARRYL G·Filed 2018·Granted Apr 16, 2019·0 cites·20 claims
- 4064US9842830B1Package including a plurality of stacked semiconductor devices including a capacitance enhanced through via and method of manufactureWALKER DARRYL G·Filed 2017·Granted Dec 12, 2017·0 cites·20 claims
- 4164US9685427B1Package including a plurality of stacked semiconductor devices including a capacitance enhanced through via and method of manufactureWALKER DARRYL G·Filed 2017·Granted Jun 20, 2017·0 cites·20 claims
- 4263US9607969B1Package including a plurality of stacked semiconductor devices including a capacitance enhanced through via and method of manufactureWALKER DARRYL G·Filed 2016·Granted Mar 28, 2017·0 cites·20 claims
- 4363US9508692B1Package including a plurality of stacked semiconductor devices including a capacitance enhanced through via and method of manufactureWALKER DARRYL G·Filed 2016·Granted Nov 29, 2016·0 cites·20 claims
- 4462US9658277B2Testing and setting performance parameters in a semiconductor device and method thereforWALKER DARRYL G·Filed 2014·Granted May 23, 2017·1 cites·20 claims
- 4562US9431088B1Package including a plurality of stacked semiconductor devices including a capacitance enhanced through via and method of manufactureWALKER DARRYL G·Filed 2016·Granted Aug 30, 2016·0 cites·20 claims
- 4659US10006959B2Testing and setting performance parameters in a semiconductor device and method thereforWALKER DARRYL G·Filed 2014·Granted Jun 26, 2018·0 cites·20 claims
- 4759US9933317B2Power up of semiconductor device having a temperature circuit and method thereforWALKER DARRYL G·Filed 2015·Granted Apr 3, 2018·0 cites·20 claims
- 4859US9548126B1Multi-chip non-volatile semiconductor memory package including heater and sensor elementsWALKER DARRYL G·Filed 2016·Granted Jan 17, 2017·0 cites·20 claims
- 4958US9958341B2Semiconductor device having temperature sensor circuit that detects a temperature range upper limit value and a temperature range lower limit valueWALKER DARRYL G·Filed 2017·Granted May 1, 2018·0 cites·20 claims
- 5057US10141058B1Multi-chip non-volatile semiconductor memory package including heater and sensor elementsWALKER DARRYL G·Filed 2015·Granted Nov 27, 2018·0 cites·17 claims
Showing the top 50 of 55 patent records by PatentIndex Score.
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