Assignee
YONEZAWA TOSHIHIRO
JP·3 granted patents·5 citations·filing 2008–2008
Technology mixG01R3
Top patents by PatentIndex Score
3 records- 0161US8674717B2Cantilevered probe having a bending contactYONEZAWA TOSHIHIRO·Filed 2008·Granted Mar 18, 2014·4 cites·1 claims
- 0244US8415964B2Probe card having a structure for being prevented from deformingYONEZAWA TOSHIHIRO·Filed 2008·Granted Apr 9, 2013·1 cites·8 claims
- 0335US8319511B2Probe device having a structure for being prevented from deformingYONEZAWA TOSHIHIRO·Filed 2008·Granted Nov 27, 2012·0 cites·4 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →