Assignee
AGRAWAL BHAVNA
US·2 granted patents·1 pending application·4 citations·filing 2008–2012
Top patents by PatentIndex Score
3 records- 0172US8560994B1Enabling statistical testing using deterministic multi-corner timing analysisAGRAWAL BHAVNA·Filed 2012·Granted Oct 15, 2013·4 cites·17 claims
- 0247US2008155484A1System and method for memory element characterizationAGRAWAL BHAVNA·Filed 2008·Application pending·0 cites
- 0343US8239794B2System and method for estimating leakage current of an electronic circuitAGRAWAL BHAVNA·Filed 2009·Granted Aug 7, 2012·0 cites·22 claims
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