Assignee
ATTOFEMTO INC
US·12 granted patents·2 pending applications·198 citations·filing 2003–2018
Top patents by PatentIndex Score
14 records- 0198US7728958B2Condition assessment method for a structure including a semiconductor materialATTOFEMTO INC·Filed 2007·Granted Jun 1, 2010·40 cites·27 claims
- 0297US7420687B2Condition assessment system for a structure including a semiconductor materialATTOFEMTO INC·Filed 2006·Granted Sep 2, 2008·32 cites·34 claims
- 0395US8040521B2Holographic condition assessment system for a structure including a semiconductor materialATTOFEMTO INC·Filed 2009·Granted Oct 18, 2011·20 cites·37 claims
- 0495US7323889B2Voltage testing and measurementATTOFEMTO INC·Filed 2005·Granted Jan 29, 2008·24 cites·7 claims
- 0593US7773230B2Interferometric condition assessment system for a microelectronic structure including a semiconductor or free-metal materialATTOFEMTO INC·Filed 2008·Granted Aug 10, 2010·14 cites·26 claims
- 0692US7400411B2Method for optically testing semiconductor devicesATTOFEMTO INC·Filed 2006·Granted Jul 15, 2008·20 cites·8 claims
- 0789US9366719B2Optical to optical methods enhancing the sensitivity and resolution of ultraviolet, electron beam and ion beam devicesATTOFEMTO INC·Filed 2013·Granted Jun 14, 2016·4 cites·22 claims
- 0886US7733499B2Method for optically testing semiconductor devicesATTOFEMTO INC·Filed 2008·Granted Jun 8, 2010·10 cites·16 claims
- 0983US9250064B2Multiple beam transmission interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor and anisotropic devicesATTOFEMTO INC·Filed 2014·Granted Feb 2, 2016·4 cites·20 claims
- 1083US8879071B2Multiple optical wavelength interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor devices and materials, wafers, and monitoring all phases of development and manufactureATTOFEMTO INC·Filed 2013·Granted Nov 4, 2014·4 cites·36 claims
- 1179US7206078B2Non-destructive testing system using a laser beamATTOFEMTO INC·Filed 2003·Granted Apr 17, 2007·24 cites·10 claims
- 1278US9952161B2Methods for obtaining and analyzing digital interferometric data for computer testing and developing semiconductor and anisotropic devices and materialsATTOFEMTO INC·Filed 2015·Granted Apr 24, 2018·2 cites·3 claims
- 1366US2016291088A1Advanced 4-dimensional signal and device testing using circuit-state recognitionATTOFEMTO INC·Filed 2016·Application pending·0 cites
- 1452US2018246045A1Optical methods for obtaining digital data to be used in determining, shaping or testing of semiconductor or anisotropic materials, or devices, under test through all stages of manufacture or developmentATTOFEMTO INC·Filed 2018·Application pending·0 cites
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