Assignee
BAYES ELECTRONICS TECH CO LTD
CN·3 granted patents·1 citations·filing 2020–2024
Top patents by PatentIndex Score
3 records- 0179US12493072B2System and method for identifying design faults or semiconductor modeling errors by analyzing failed transient simulation of an integrated circuitBAYES ELECTRONICS TECH CO LTD·Filed 2020·Granted Dec 9, 2025·1 cites·20 claims
- 0253US12387026B2Method for automatic control of simulation error in analog circuit and use thereofBAYES ELECTRONICS TECH CO LTD·Filed 2024·Granted Aug 12, 2025·0 cites·16 claims
- 0352US12112111B1Method for analyzing static analog integrated circuit layoutBAYES ELECTRONICS TECH CO LTD·Filed 2024·Granted Oct 8, 2024·0 cites·10 claims
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