Assignee
COHEN GUY M
US·11 granted patents·1 pending application·63 citations·filing 2008–2012
Top patents by PatentIndex Score
12 records- 0194US8642403B1Replacement contacts for all-around contactsCOHEN GUY M·Filed 2012·Granted Feb 4, 2014·16 cites·20 claims
- 0293US8574969B2CMOS with channel P-FinFET and channel N-FinFET having different crystalline orientations and parallel finsCOHEN GUY M·Filed 2012·Granted Nov 5, 2013·11 cites·4 claims
- 0392US8692229B2Replacement contacts for all-around contactsCOHEN GUY M·Filed 2012·Granted Apr 8, 2014·12 cites·15 claims
- 0487US8241970B2CMOS with channel P-FinFET and channel N-FinFET having different crystalline orientations and parallel finsCOHEN GUY M·Filed 2008·Granted Aug 14, 2012·8 cites·10 claims
- 0583US8119434B2Fast p-i-n photodetector with high responsitivityCOHEN GUY M·Filed 2009·Granted Feb 21, 2012·8 cites·20 claims
- 0672US8557665B2Self-aligned metal-semiconductor alloy and metallization for sub-lithographic source and drain contactsCOHEN GUY M·Filed 2009·Granted Oct 15, 2013·4 cites·20 claims
- 0770US8563369B2CMOS with channel P-FinFET and channel N-FinFET having different crystalline orientations and parallel finsCOHEN GUY M·Filed 2012·Granted Oct 22, 2013·1 cites·10 claims
- 0861US8169031B2Continuous metal semiconductor alloy via for interconnectsCOHEN GUY M·Filed 2008·Granted May 1, 2012·1 cites·9 claims
- 0956US8220068B2Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growthCOHEN GUY M·Filed 2009·Granted Jul 10, 2012·1 cites·14 claims
- 1055US8308968B2Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growthCOHEN GUY M·Filed 2009·Granted Nov 13, 2012·1 cites·13 claims
- 1155US2008251880A1Mixed orientation and mixed material semiconductor-on-insulator waferCOHEN GUY M·Filed 2008·Application pending·0 cites
- 1250US8547335B2RFID-based input deviceCOHEN GUY M·Filed 2010·Granted Oct 1, 2013·0 cites·14 claims
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