Assignee
CULP JAMES A
US·8 granted patents·11 citations·filing 2009–2012
Top patents by PatentIndex Score
8 records- 0184US8239790B2Methods and system for analysis and management of parametric yieldCULP JAMES A·Filed 2011·Granted Aug 7, 2012·4 cites·20 claims
- 0268US8232215B2Spacer linewidth controlCULP JAMES A·Filed 2009·Granted Jul 31, 2012·2 cites·18 claims
- 0366US8429576B2Methods and system for analysis and management of parametric yieldCULP JAMES A·Filed 2012·Granted Apr 23, 2013·1 cites·20 claims
- 0466US8302068B2Leakage aware design post-processingCULP JAMES A·Filed 2010·Granted Oct 30, 2012·1 cites·18 claims
- 0562US8301290B2System and method for correcting systematic parametric variations on integrated circuit chips in order to minimize circuit limited yield lossCULP JAMES A·Filed 2009·Granted Oct 30, 2012·2 cites·24 claims
- 0658US8470713B2Nitride etch for improved spacer uniformityCULP JAMES A·Filed 2010·Granted Jun 25, 2013·1 cites·20 claims
- 0750US8336008B2Characterization of long range variabilityCULP JAMES A·Filed 2009·Granted Dec 18, 2012·0 cites·23 claims
- 0843US8141027B2Automated sensitivity definition and calibration for design for manufacturing toolsCULP JAMES A·Filed 2010·Granted Mar 20, 2012·0 cites·17 claims
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